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There are 22586 results for: content related to: Ion Implantation

  1. High Energy Ion Beam Analysis Techniques

    Standard Article

    Materials Science and Technology

    Wei-Kan Chu, Jiarui Liu, Zuhua Zhang and Ki Bui Ma

    Published Online : 15 SEP 2006, DOI: 10.1002/9783527603978.mst0026

  2. Elastic Recoil Detection Analysis

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    Encyclopedia of Analytical Chemistry

    Patrick Trocellier and Timo Sajavaara

    Published Online : 29 SEP 2008, DOI: 10.1002/9780470027318.a6205.pub2

  3. Rutherford Backscattering Spectrometry

    Surfaces and Interfaces of Electronic Materials

    Leonard J. Brillson, Pages: 183–196, 2012

    Published Online : 28 DEC 2012, DOI: 10.1002/9783527665709.ch11

  4. Ion Implantation

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    Kirk-Othmer Encyclopedia of Chemical Technology

    Michael Nastasi, James W. Mayer and Kevin C. Walter

    Published Online : 18 MAR 2005, DOI: 10.1002/0471238961.09151423011220.a01.pub2

  5. The Ion Spectroscopies

    Spectroscopy in Catalysis: An Introduction, Second Edition

    J. W. Niemantsverdriet, Pages: 79–111, 2007

    Published Online : 21 DEC 2007, DOI: 10.1002/9783527614127.ch4

  6. Depth Profiling

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    Encyclopedia of Analytical Chemistry

    Guillaume Martin, Philippe Garcia and Thierry Sauvage

    Published Online : 15 SEP 2009, DOI: 10.1002/9780470027318.a9063

  7. Ion/Neutral Probe Techniques

    Handbook of Spectroscopy: Second, Enlarged Edition

    Anna Macková, Andrew Pratt, Pages: 741–778, 2014

    Published Online : 2 APR 2014, DOI: 10.1002/9783527654703.ch19

  8. Barrier-Type anodic films on aluminium in aqueous borate solutions: 1—Film density and stopping power of anodic alumina films for alpha particles

    Surface and Interface Analysis

    Volume 5, Issue 6, December 1983, Pages: 247–251, P. Skeldon, K. Shimizu, G. E. Thompson and G. C. Wood

    Article first published online : 15 SEP 2004, DOI: 10.1002/sia.740050605

  9. Thermal tuning of planar Bragg gratings in silicon-on-insulator rib waveguides

    physica status solidi (c)

    Volume 6, Issue S1, May 2009, Pages: S240–S243, Shabnam Homampour, Michael P. Bulk, Paul E. Jessop and Andrew P. Knights

    Article first published online : 8 APR 2009, DOI: 10.1002/pssc.200881298

  10. Damage formation in Ge during Ar+ implantation at 15 K

    physica status solidi (c)

    Volume 5, Issue 2, February 2008, Pages: 583–586, M. Hayes, A. Schroeter, E. Wendler, W. Wesch, F. D. Auret and J. M. Nel

    Article first published online : 4 JAN 2008, DOI: 10.1002/pssc.200776811

  11. Chemical and Physical Characterization

    Semiconductor Material and Device Characterization, Third Edition

    Dieter K. Schroder, Pages: 627–688, 2005

    Published Online : 7 APR 2005, DOI: 10.1002/0471749095.ch11

  12. Silicon-On-Insulator (SOI) Photonics

    Silicon Photonics: An Introduction

    Graham T. Reed, Andrew P. Knights, Pages: 57–110, 2005

    Published Online : 28 JAN 2005, DOI: 10.1002/0470014180.ch4

  13. The Behaviour of Arsenic in Crystals of Silicon during Self-Annealing Ion Implantation

    physica status solidi (a)

    Volume 112, Issue 1, 16 March 1989, Pages: 323–326, F. F. Komakov, A. P. Novikov, E. V. Kotov and E. A. Podlipko

    Article first published online : 15 FEB 2006, DOI: 10.1002/pssa.2211120138

  14. Growth of thin Ti films on Al single-crystal surfaces at room temperature

    Surface and Interface Analysis

    Volume 27, Issue 4, April 1999, Pages: 185–193, R. J. Smith, Y. W. Kim, N. R. Shivaparan, G. A. White and M. A. Teter

    Article first published online : 5 MAY 1999, DOI: 10.1002/(SICI)1096-9918(199904)27:4<185::AID-SIA467>3.0.CO;2-H

  15. Rutherford Backscattering Spectroscopy

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    Encyclopedia of Analytical Chemistry

    Kenji Kimura

    Published Online : 15 SEP 2006, DOI: 10.1002/9780470027318.a6215

  16. You have free access to this content

    Advanced Circuits for Emerging Technologies

    Krzysztof Iniewski, Pages: 599–615, 2012

    Published Online : 7 MAY 2012, DOI: 10.1002/9781118181508.index

  17. Silicon Device Processing

    Silicon Devices: Structures and Processing

    Kenneth A. Jackson, Pages: 113–193, 2007

    Published Online : 21 DEC 2007, DOI: 10.1002/9783527611805.ch3

  18. Low-Energy Ion Scattering and Rutherford Backscattering

    Surface Analysis - The Principal Techniques, 2nd Edition

    John C. Vickerman, Ian S. Gilmore, Pages: 269–331, 2009

    Published Online : 27 MAR 2009, DOI: 10.1002/9780470721582.ch6

  19. Flux Dependence of Damage Accumulation in Silicon during Ion Bombardment

    physica status solidi (a)

    Volume 98, Issue 2, 16 December 1986, Pages: 527–534, K. Holldack and H. Kerkow

    Article first published online : 17 FEB 2006, DOI: 10.1002/pssa.2210980225

  20. Elastic Recoil Detection Analysis

    Standard Article

    Characterization of Materials

    François Schiettekatte and Martin Chicoine

    Published Online : 12 OCT 2012, DOI: 10.1002/0471266965.com140