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There are 169214 results for: content related to: N-Type Self-Assembled Monolayer Field-Effect Transistors and Complementary Inverters

  1. Thermal Stability and Molecular Ordering of Organic Semiconductor Monolayers: Effect of an Anchor Group


    Volume 16, Issue 8, June 8, 2015, Pages: 1712–1718, Dr. Andrew O. F. Jones, Philipp Knauer, Prof. Roland Resel, Dr. Andreas Ringk, Prof. Peter Strohriegl, Dr. Oliver Werzer and Prof. Michele Sferrazza

    Version of Record online : 31 MAR 2015, DOI: 10.1002/cphc.201500098

  2. The Relationship between Structural and Electrical Characteristics in Perylenecarboxydiimide-Based Nanoarchitectures

    Advanced Functional Materials

    Volume 25, Issue 17, May 6, 2015, Pages: 2501–2510, Chiara Musumeci, Ingo Salzmann, Sara Bonacchi, Christian Röthel, Steffen Duhm, Norbert Koch and Paolo Samorì

    Version of Record online : 16 MAR 2015, DOI: 10.1002/adfm.201403773

  3. Surface and interface roughness estimations by X-ray reflectivity and RBS measurements

    Surface and Interface Analysis

    Volume 46, Issue 12-13, December 2014, Pages: 1208–1211, Y. Fujii, K. Nakajima, M. Suzuki and K. Kimura

    Version of Record online : 28 JUL 2014, DOI: 10.1002/sia.5644

  4. Combined Structure-Texture-Microstructure-Stress-Phase Reflectivity Analysis

    Combined Analysis

    Daniel Chateigner, Pages: 257–362, 2013

    Published Online : 7 MAR 2013, DOI: 10.1002/9781118622506.ch9

  5. X-Ray Reflectometry Characterization of Plasma Polymer Films Synthesized from Triallylamine: Density and Swelling in Water

    Plasma Processes and Polymers

    Volume 10, Issue 6, June 2013, Pages: 517–525, Mauricio Schieda, Fethi Salah, Stéphanie Roualdès, Arie van der Lee, Eric Beche and Jean Durand

    Version of Record online : 11 MAR 2013, DOI: 10.1002/ppap.201200126

  6. A combined X-ray, ellipsometry and atomic force microscopy study on thin parylene-C films

    physica status solidi (a)

    Volume 206, Issue 8, August 2009, Pages: 1727–1730, Heinz-Georg Flesch, Oliver Werzer, Martin Weis, Ján Jakabovič, Jaroslav Kováč, Daniel Haško, Georg Jakopič, Harry J. Wondergem and Roland Resel

    Version of Record online : 22 JUN 2009, DOI: 10.1002/pssa.200881616

  7. Density Investigation by X-ray Reflectivity for Thin Films Synthesized Using Atmospheric CVD

    Chemical Vapor Deposition

    Volume 14, Issue 9-10, September/October 2008, Pages: 303–308, Shinichi Kishimoto, Tomoaki Hashiguchi, Shigeo Ohshio and Hidetoshi Saitoh

    Version of Record online : 6 OCT 2008, DOI: 10.1002/cvde.200806703

  8. An interactive graphical user interface (GUI) for the CATGIXRF program – for microstructural evaluation of thin film and impurity doped surfaces

    X-Ray Spectrometry

    Volume 45, Issue 4, July/August 2016, Pages: 212–219, M. K. Tiwari and Gangadhar Das

    Version of Record online : 22 MAR 2016, DOI: 10.1002/xrs.2692

  9. Characterization of 31 nonperiodic layers of alternate SiO2/Nb2O5 on glass for optical filters by SIMS, XRR, and ellipsometry

    Surface and Interface Analysis

    Volume 45, Issue 1, January 2013, Pages: 490–493, Kirsten I. Schiffmann and Michael Vergöhl

    Version of Record online : 31 MAY 2012, DOI: 10.1002/sia.5046

  10. Growth and Properties of Hybrid Organic-Inorganic Metalcone Films Using Molecular Layer Deposition Techniques

    Advanced Functional Materials

    Volume 23, Issue 5, February 5, 2013, Pages: 532–546, Byoung H. Lee, Byunghoon Yoon, Aziz I. Abdulagatov, Robert A. Hall and Steven M. George

    Version of Record online : 7 SEP 2012, DOI: 10.1002/adfm.201200370

  11. Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis

    physica status solidi (a)

    Volume 212, Issue 3, March 2015, Pages: 523–528, Philipp Hönicke, Blanka Detlefs, Matthias Müller, Erik Darlatt, Emmanuel Nolot, Helen Grampeix and Burkhard Beckhoff

    Version of Record online : 4 FEB 2015, DOI: 10.1002/pssa.201400204

  12. In Operando GIXRD and XRR on Polycrystalline In52Pd48

    Zeitschrift für anorganische und allgemeine Chemie

    Volume 640, Issue 15, December 2014, Pages: 3065–3069, Dennis C. A. Ivarsson, Matthias Neumann, Alexander A. Levin, Toni Keilhauer, Peter Wochner and Marc Armbrüster

    Version of Record online : 8 JUL 2014, DOI: 10.1002/zaac.201400223

  13. Coordination-Based Molecular Assemblies of Oligofurans and Oligothiophenes

    Chemistry - A European Journal

    Volume 19, Issue 27, July 1, 2013, Pages: 8821–8831, Adva Hayoun Barak, Graham de Ruiter, Dr. Michal Lahav, Dr. Sagar Sharma, Dr. Ori Gidron, Dr. Guennadi Evmenenko, Prof. Pulak Dutta, Prof. Michael Bendikov and Prof. Milko E. van der Boom

    Version of Record online : 16 MAY 2013, DOI: 10.1002/chem.201300034

  14. Analysis of surface roughness correlation function by X-ray reflectivity

    Surface and Interface Analysis

    Yoshikazu Fujii

    Version of Record online : 8 AUG 2016, DOI: 10.1002/sia.6110

  15. High-resolution scanning electron microscopy study of sputtered nanolaminated Ti/TiN multilayers


    Volume 22, Issue 4, July/August 2000, Pages: 258–262, C. le Paven-Thivet, C. Sant, F. Grillon and P. Houdy

    Version of Record online : 6 DEC 2006, DOI: 10.1002/sca.4950220405

  16. You have full text access to this OnlineOpen article
    Synchrotron based operando surface X-ray scattering study towards structure–activity relationships of model electrocatalysts


    Volume 1, Issue 5, April 16, 2016, Pages: 1104–1108, Andrey Goryachev, Dr. Francesco Carlà, Dr. Jakub Drnec, Willem G. Onderwaater, Dr. Roberto Felici, Philipp P. T. Krause, Ad H. Wonders, Prof. Emiel J. M. Hensen and Dr. Jan P. Hofmann

    Version of Record online : 29 APR 2016, DOI: 10.1002/slct.201600355

  17. Solution-Processable Septithiophene Monolayer Transistor

    Advanced Materials

    Volume 24, Issue 7, February 14, 2012, Pages: 973–978, Matthieu Defaux, Fatemeh Gholamrezaie, Jingbo Wang, Andreas Kreyes, Ulrich Ziener, Denis V. Anokhin, Dimitri A. Ivanov, Armin Moser, Alfred Neuhold, Ingo Salzmann, Roland Resel, Dago M. de Leeuw, Stefan C. J. Meskers, Martin Moeller and Ahmed Mourran

    Version of Record online : 19 JAN 2012, DOI: 10.1002/adma.201103522

  18. Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment

    Journal of Applied Crystallography

    Volume 41, Issue 1, February 2008, Pages: 143–152, P. Colombi, D. K. Agnihotri, V. E. Asadchikov, E. Bontempi, D. K. Bowen, C. H. Chang, L. E. Depero, M. Farnworth, T. Fujimoto, A. Gibaud, M. Jergel, M. Krumrey, T. A. Lafford, A. Lamperti, T. Ma, R. J. Matyi, M. Meduna, S. Milita, K. Sakurai, L. Shabel'nikov, A. Ulyanenkov, A. Van der Lee and C. Wiemer

    DOI: 10.1107/S0021889807051904

  19. Stability of thermoresponsive methylcellulose thin film: x-ray reflectivity study

    X-Ray Spectrometry

    Volume 38, Issue 5, September/October 2009, Pages: 376–381, Vallerie Ann Innis-Samson and Kenji Sakurai

    Version of Record online : 1 JUN 2009, DOI: 10.1002/xrs.1182

  20. Dual-Gate Thin-Film Transistors, Integrated Circuits and Sensors

    Advanced Materials

    Volume 23, Issue 29, August 2, 2011, Pages: 3231–3242, Mark-Jan Spijkman, Kris Myny, Edsger C. P. Smits, Paul Heremans, Paul W. M. Blom and Dago M. de Leeuw

    Version of Record online : 14 JUN 2011, DOI: 10.1002/adma.201101493