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There are 8127 results for: content related to: X-Ray Photoelectron Spectroscopy for Characterization of Bionanocomposite Functional Materials for Energy-Harvesting Technologies

  1. Report on the 47th IUVSTA Workshop ‘Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films’

    Surface and Interface Analysis

    Volume 41, Issue 11, November 2009, Pages: 840–857, A. Herrera-Gomez, J. T. Grant, P. J. Cumpson, M. Jenko, F. S. Aguirre-Tostado, C. R. Brundle, T. Conard, G. Conti, C. S. Fadley, J. Fulghum, K. Kobayashi, L. Kövér, H. Nohira, R. L. Opila, S. Oswald, R. W. Paynter, R. M. Wallace, W. S. M. Werner and J. Wolstenholme

    Article first published online : 7 OCT 2009, DOI: 10.1002/sia.3105

  2. Influence of Substituents and Functional Groups on the Surface Composition of Ionic Liquids

    Chemistry - A European Journal

    Volume 20, Issue 14, April 1, 2014, Pages: 3954–3965, Dr. Claudia Kolbeck, Inga Niedermaier, Dr. Alexey Deyko, Dr. Kevin R. J. Lovelock, Dr. Nicola Taccardi, Wei Wei, Prof. Dr. Peter Wasserscheid, Dr. Florian Maier and Prof. Dr. Hans-Peter Steinrück

    Article first published online : 18 MAR 2014, DOI: 10.1002/chem.201304549

  3. Information on compositional depth profiles conveyed by angle-resolved XPS

    Surface and Interface Analysis

    Volume 23, Issue 9, August 1995, Pages: 589–600, M. Seelmann-Eggebert and Robert C. Keller

    Article first published online : 15 SEP 2004, DOI: 10.1002/sia.740230904

  4. Interlaboratory study comparing analyses of simulated angle-resolved X-ray photoelectron spectroscopy data

    Surface and Interface Analysis

    Volume 46, Issue 5, May 2014, Pages: 321–332, G. Tasneem, W. S. M. Werner, W. Smekal and C. J. Powell

    Article first published online : 17 MAR 2014, DOI: 10.1002/sia.5482

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    Quantitative ARXPS investigation of systems with ultrathin aluminium oxide layers

    Surface and Interface Analysis

    Volume 36, Issue 13, 2004, Pages: 1600–1608, M. Kozłowska, R. Reiche, S. Oswald, H. Vinzelberg, R. Hübner and K. Wetzig

    Article first published online : 20 OCT 2004, DOI: 10.1002/sia.1988

  6. You have free access to this content
    Modeling of complex surface structures for ARXPS

    Surface and Interface Analysis

    Volume 40, Issue 3-4, March - April 2008, Pages: 700–705, S. Oswald and F. Oswald

    Article first published online : 22 FEB 2008, DOI: 10.1002/sia.2756

  7. Error surface calculations on the parameters defining oxygen depth profile models fitted to ARXPS data obtained from polystyrene exposed to an oxygen/helium plasma

    Surface and Interface Analysis

    Volume 35, Issue 11, November 2003, Pages: 932–939, R. W. Paynter

    Article first published online : 4 NOV 2003, DOI: 10.1002/sia.1629

  8. Interfacial reaction during MOCVD growth revealed by in situ ARXPS

    Surface and Interface Analysis

    Volume 38, Issue 4, April 2006, Pages: 579–582, A. Brevet, R. Chassagnon, L. Imhoff, M. C. Marco de Lucas, B. Domenichini and S. Bourgeois

    Article first published online : 29 MAR 2006, DOI: 10.1002/sia.2293

  9. Angle-resolved XPS study of the effect of x-radiation on the aging of polystyrene exposed to an oxygen/argon plasma

    Surface and Interface Analysis

    Volume 33, Issue 1, January 2002, Pages: 14–22, R. W. Paynter

    Article first published online : 14 JAN 2002, DOI: 10.1002/sia.1155

  10. XPS/ISS Investigation of Carbon Fibers Sequentially Exposed to Nitric Acid and Sodium Hydroxide

    Surface and Interface Analysis

    Volume 24, Issue 5, May 1996, Pages: 311–320, Steven D. Gardner, Chakravarthy S. K. Singamsetty, Zhihong Wu and Charles U. Pittman Jr.

    Article first published online : 4 DEC 1998, DOI: 10.1002/(SICI)1096-9918(199605)24:5<311::AID-SIA120>3.0.CO;2-Z

  11. Comparison of the Tougaard, ARXPS, RBS and ellipsometry methods to determine the thickness of thin SiO2 layers

    Surface and Interface Analysis

    Volume 33, Issue 3, March 2002, Pages: 238–244, B. S. Semak, C. van der Marel and S. Tougaard

    Article first published online : 1 MAR 2002, DOI: 10.1002/sia.1206

  12. Angle-resolved XPS: a critical evaluation for various applications

    Surface and Interface Analysis

    Volume 38, Issue 4, April 2006, Pages: 590–594, S. Oswald, M. Zier, R. Reiche and K. Wetzig

    Article first published online : 29 MAR 2006, DOI: 10.1002/sia.2216

  13. Fick's law of diffusion depth profiles applied to the degradation of oxidized polystyrene during ARXPS analysis

    Surface and Interface Analysis

    Volume 37, Issue 5, May 2005, Pages: 466–471, M. Ménard and R. W. Paynter

    Article first published online : 4 APR 2005, DOI: 10.1002/sia.2036

  14. Study of the degradation of plasma-oxidized polystyrene by time- and angle-resolved x-ray photoelectron spectroscopy

    Surface and Interface Analysis

    Volume 35, Issue 6, June 2003, Pages: 502–514, M.-C. Tremblay and R. W. Paynter

    Article first published online : 12 JUN 2003, DOI: 10.1002/sia.1564

  15. Angle-resolved x-ray photoelectron spectroscopy studies of the evolution of plasma-treated surfaces with time

    Surface and Interface Analysis

    Volume 27, Issue 2, February 1999, Pages: 103–113, R. W. Paynter

    Article first published online : 4 MAR 1999, DOI: 10.1002/(SICI)1096-9918(199902)27:2<103::AID-SIA477>3.0.CO;2-1

  16. Temperature-Dependent Surface-Enrichment Effects of Imidazolium-Based Ionic Liquids

    ChemPhysChem

    Volume 14, Issue 16, November 11, 2013, Pages: 3726–3730, Dr. Claudia Kolbeck, Dr. Alexey Deyko, Dr. Takashi Matsuda, Florian T. U. Kohler, Prof. Dr. Peter Wasserscheid, Dr. Florian Maier and Prof. Dr. Hans-Peter Steinrück

    Article first published online : 2 OCT 2013, DOI: 10.1002/cphc.201300719

  17. Surface roughness and island formation effects in ARXPS quantification

    Surface and Interface Analysis

    Volume 36, Issue 8, August 2004, Pages: 788–792, A. I. Martín-Concepción, F. Yubero, J. P. Espinós and S. Tougaard

    Article first published online : 11 AUG 2004, DOI: 10.1002/sia.1765

  18. Simulation study on regeneration of depth profiles from angle-resolved XPS data

    Surface and Interface Analysis

    Volume 25, Issue 11, October 1997, Pages: 869–877, Chul-Un Ro

    Article first published online : 4 DEC 1998, DOI: 10.1002/(SICI)1096-9918(199710)25:11<869::AID-SIA310>3.0.CO;2-D

  19. Study of ultrathin silicon oxide films by FTIR-ATR and ARXPS after wet chemical cleaning processes

    Surface and Interface Analysis

    Volume 34, Issue 1, August 2002, Pages: 445–450, D. Rouchon, N. Rochat, F. Gustavo, A. Chabli, O. Renault and P. Besson

    Article first published online : 18 SEP 2002, DOI: 10.1002/sia.1335

  20. Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy data

    Surface and Interface Analysis

    Volume 43, Issue 7, July 2011, Pages: 1046–1056, C. J. Powell, W. S. M. Werner and W. Smekal

    Article first published online : 3 SEP 2010, DOI: 10.1002/sia.3689