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There are 446698 results for: content related to: Dynamics of Monolayer–Island Transitions in 2,7-Dioctyl-benzothienobenzthiophene Thin Films

  1. Density Investigation by X-ray Reflectivity for Thin Films Synthesized Using Atmospheric CVD

    Chemical Vapor Deposition

    Volume 14, Issue 9-10, September/October 2008, Pages: 303–308, Shinichi Kishimoto, Tomoaki Hashiguchi, Shigeo Ohshio and Hidetoshi Saitoh

    Version of Record online : 6 OCT 2008, DOI: 10.1002/cvde.200806703

  2. Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis

    physica status solidi (a)

    Volume 212, Issue 3, March 2015, Pages: 523–528, Philipp Hönicke, Blanka Detlefs, Matthias Müller, Erik Darlatt, Emmanuel Nolot, Helen Grampeix and Burkhard Beckhoff

    Version of Record online : 4 FEB 2015, DOI: 10.1002/pssa.201400204

  3. Thermal Stability and Molecular Ordering of Organic Semiconductor Monolayers: Effect of an Anchor Group

    ChemPhysChem

    Volume 16, Issue 8, June 8, 2015, Pages: 1712–1718, Dr. Andrew O. F. Jones, Philipp Knauer, Prof. Roland Resel, Dr. Andreas Ringk, Prof. Peter Strohriegl, Dr. Oliver Werzer and Prof. Michele Sferrazza

    Version of Record online : 31 MAR 2015, DOI: 10.1002/cphc.201500098

  4. Combined Structure-Texture-Microstructure-Stress-Phase Reflectivity Analysis

    Combined Analysis

    Daniel Chateigner, Pages: 257–362, 2013

    Published Online : 7 MAR 2013, DOI: 10.1002/9781118622506.ch9

  5. An interactive graphical user interface (GUI) for the CATGIXRF program – for microstructural evaluation of thin film and impurity doped surfaces

    X-Ray Spectrometry

    Volume 45, Issue 4, July/August 2016, Pages: 212–219, M. K. Tiwari and Gangadhar Das

    Version of Record online : 22 MAR 2016, DOI: 10.1002/xrs.2692

  6. Observation of surface contamination layer by X-ray reflectometry (XRR) analyses

    Surface and Interface Analysis

    Chang Soo Kim, Hyeon-Gu Jeon, Young Jung, Minhyuk Choi, Byungsung O and Ki-Hong Kim

    Version of Record online : 25 OCT 2016, DOI: 10.1002/sia.6188

  7. In Operando GIXRD and XRR on Polycrystalline In52Pd48

    Zeitschrift für anorganische und allgemeine Chemie

    Volume 640, Issue 15, December 2014, Pages: 3065–3069, Dennis C. A. Ivarsson, Matthias Neumann, Alexander A. Levin, Toni Keilhauer, Peter Wochner and Marc Armbrüster

    Version of Record online : 8 JUL 2014, DOI: 10.1002/zaac.201400223

  8. Coordination-Based Molecular Assemblies of Oligofurans and Oligothiophenes

    Chemistry - A European Journal

    Volume 19, Issue 27, July 1, 2013, Pages: 8821–8831, Adva Hayoun Barak, Graham de Ruiter, Dr. Michal Lahav, Dr. Sagar Sharma, Dr. Ori Gidron, Dr. Guennadi Evmenenko, Prof. Pulak Dutta, Prof. Michael Bendikov and Prof. Milko E. van der Boom

    Version of Record online : 16 MAY 2013, DOI: 10.1002/chem.201300034

  9. Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment

    Journal of Applied Crystallography

    Volume 41, Issue 1, February 2008, Pages: 143–152, P. Colombi, D. K. Agnihotri, V. E. Asadchikov, E. Bontempi, D. K. Bowen, C. H. Chang, L. E. Depero, M. Farnworth, T. Fujimoto, A. Gibaud, M. Jergel, M. Krumrey, T. A. Lafford, A. Lamperti, T. Ma, R. J. Matyi, M. Meduna, S. Milita, K. Sakurai, L. Shabel'nikov, A. Ulyanenkov, A. Van der Lee and C. Wiemer

    DOI: 10.1107/S0021889807051904

  10. Initial Stage Growth during Plasma-Enhanced Atomic Layer Deposition of Cobalt

    Chemical Vapor Deposition

    Volume 18, Issue 1-3, March 2012, Pages: 41–45, Han-Bo-Ram Lee, Yong Jun Park, Sunggi Baik and Hyungjun Kim

    Version of Record online : 5 MAR 2012, DOI: 10.1002/cvde.201106937

  11. Applications of the ‘CATGIXRF’ computer program to the grazing incidence X-ray fluorescence and X-ray reflectivity characterization of thin films and surfaces

    X-Ray Spectrometry

    Volume 39, Issue 2, March/April 2010, Pages: 127–134, M. K. Tiwari, G. S. Lodha and K. J. S. Sawhney

    Version of Record online : 23 SEP 2009, DOI: 10.1002/xrs.1215

  12. Post Porosity Plasma Protection: Scaling of Efficiency with Porosity

    Advanced Functional Materials

    Volume 22, Issue 14, July 24, 2012, Pages: 3043–3050, Theo Frot, Willi Volksen, Sampath Purushothaman, Robert L. Bruce, Teddie Magbitang, Dolores C. Miller, Vaughn R. Deline and Geraud Dubois

    Version of Record online : 17 APR 2012, DOI: 10.1002/adfm.201200152

  13. Characterization of thin films for X-ray and neutron waveguiding by X-ray reflectivity and atomic force microscopy

    physica status solidi (a)

    Volume 210, Issue 11, November 2013, Pages: 2416–2422, Daniele Pelliccia, Sasikaran Kandasamy and Michael James

    Version of Record online : 19 AUG 2013, DOI: 10.1002/pssa.201330113

  14. Study of roughness in multilayer Mo–Si mirrors

    physica status solidi (a)

    Volume 208, Issue 11, November 2011, Pages: 2623–2628, G. A. Valkovskiy, M. V. Baidakova, P. N. Brunkov, S. G. Konnikov, M. A. Yagovkina and Ju. M. Zadiranov

    Version of Record online : 4 OCT 2011, DOI: 10.1002/pssa.201184274

  15. Surface and interface roughness estimations by X-ray reflectivity and RBS measurements

    Surface and Interface Analysis

    Volume 46, Issue 12-13, December 2014, Pages: 1208–1211, Y. Fujii, K. Nakajima, M. Suzuki and K. Kimura

    Version of Record online : 28 JUL 2014, DOI: 10.1002/sia.5644

  16. Controlled Deposition of Silver Nanoparticles in Mesoporous Single- or Multilayer Thin Films: From Tuned Pore Filling to Selective Spatial Location of Nanometric Objects

    Small

    Volume 5, Issue 2, January 19, 2009, Pages: 272–280, M. C. Fuertes, M. Marchena, M. C. Marchi, A. Wolosiuk and G. J. A. A. Soler-Illia

    Version of Record online : 29 DEC 2008, DOI: 10.1002/smll.200800894

  17. Molecular Layer Deposition of Zircone and ZrO2/Zircone Alloy Films: Growth and Properties

    Chemical Vapor Deposition

    Volume 19, Issue 4-6, June 2013, Pages: 204–212, Byoung H. Lee, Virginia R. Anderson and Steven M. George

    Version of Record online : 22 MAY 2013, DOI: 10.1002/cvde.201207045

  18. X-ray investigations of GaInN single quantum wells grown by atomic layer epitaxy and metalorganic vapor phase epitaxy

    physica status solidi (c)

    Volume 11, Issue 3-4, April 2014, Pages: 393–396, Guangxu Ju, Yoshihiro Kato, Yoshio Honda, Masao Tabuchi, Yoshikazu Takeda and Hiroshi Amano

    Version of Record online : 20 FEB 2014, DOI: 10.1002/pssc.201300670

  19. A combined X-ray, ellipsometry and atomic force microscopy study on thin parylene-C films

    physica status solidi (a)

    Volume 206, Issue 8, August 2009, Pages: 1727–1730, Heinz-Georg Flesch, Oliver Werzer, Martin Weis, Ján Jakabovič, Jaroslav Kováč, Daniel Haško, Georg Jakopič, Harry J. Wondergem and Roland Resel

    Version of Record online : 22 JUN 2009, DOI: 10.1002/pssa.200881616

  20. Characterization of 31 nonperiodic layers of alternate SiO2/Nb2O5 on glass for optical filters by SIMS, XRR, and ellipsometry

    Surface and Interface Analysis

    Volume 45, Issue 1, January 2013, Pages: 490–493, Kirsten I. Schiffmann and Michael Vergöhl

    Version of Record online : 31 MAY 2012, DOI: 10.1002/sia.5046