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There are 11155 results for: content related to: AlGaN/GaN heterojunction bipolar transistors by ammonia molecular beam epitaxy

  1. InP-Based Devices and Circuits

    RF Technologies for Low Power Wireless Communications

    Dimitris Pavlidis, Donald Sawdai, George I. Haddad, Pages: 79–124, 2002

    Published Online : 15 JAN 2002, DOI: 10.1002/0471221643.ch3

  2. Palladium-based on-wafer electroluminescence studies of GaN-based LED structures

    physica status solidi (c)

    Volume 5, Issue 6, May 2008, Pages: 2219–2221, C. O. Salcianu, E. J. Thrush, R. G. Plumb, A. R. Boyd, O. Rockenfeller, D. Schmitz, M. Heuken and C. J. Humphreys

    Version of Record online : 16 APR 2008, DOI: 10.1002/pssc.200778576

  3. Amplifier and Transistor Noise-Parameter Measurements

    Standard Article

    Wiley Encyclopedia of Electrical and Electronics Engineering

    James Randa

    Published Online : 15 SEP 2014, DOI: 10.1002/047134608X.W8219

  4. An impedance and power flow measurement system suitable for on-wafer microwave device large-signal characterization

    International Journal of RF and Microwave Computer-Aided Engineering

    Volume 20, Issue 3, May 2010, Pages: 306–312, Walid S. El-Deeb, Souheil Bensmida, Noureddine Boulejfen and Fadhel M. Ghannouchi

    Version of Record online : 12 FEB 2010, DOI: 10.1002/mmce.20434

  5. Extraction of an avalanche diode noise model for its application as an on-wafer noise source

    Microwave and Optical Technology Letters

    Volume 38, Issue 2, 20 July 2003, Pages: 89–92, M. C. Maya, A. Lázaro and L. Pradell

    Version of Record online : 29 MAY 2003, DOI: 10.1002/mop.10979

  6. Electronics

    Eshbach's Handbook of Engineering Fundamentals, Fifth Edition

    John D. Cressler, Kavita Nair, Chris Zillmer, Dennis Polla, Ramesh Harjani, Arbee L. P. Chen, Yi-Hung Wu, Konstantinos Misiakos, Clarence W. de Silva, Georges Grinstein, Marjan Trutschl, Halit Eren, N. Ranganathan, Raju D. Venkataramana, Robert P. Colwell, Andrew Rusek, Alex Q. Huang, Bo Zhang, Pages: 949–1110, 2009

    Published Online : 8 JAN 2009, DOI: 10.1002/9780470432754.ch17

  7. Contamination inspection on wafer with oxide or nitride film by using a vibrating contact potential difference probe

    Surface and Interface Analysis

    Volume 42, Issue 9, September 2010, Pages: 1489–1494, Ming-Peng Yeh and Chih-Lun Hong

    Version of Record online : 30 MAR 2010, DOI: 10.1002/sia.3325

  8. DC-to-67 GHz high-speed BiCMOS BJT characterization with on-wafer calibration and EM-based de-embedding

    Microwave and Optical Technology Letters

    Volume 56, Issue 6, June 2014, Pages: 1285–1292, Juseok Bae, Scott Jordan and Cam Nguyen

    Version of Record online : 17 MAR 2014, DOI: 10.1002/mop.28350

  9. A comparison of shielded and conventional on-wafer test-fixture forward coupling on silicon-on-insulator (SOI) substrate

    Microwave and Optical Technology Letters

    Volume 45, Issue 1, 5 April 2005, Pages: 70–75, Tero Kaija and Eero O. Ristolainen

    Version of Record online : 25 FEB 2005, DOI: 10.1002/mop.20727

  10. Automatic testing of MMIC wafers

    International Journal of Microwave and Millimeter-Wave Computer-Aided Engineering

    Volume 1, Issue 1, 1991, Pages: 77–89, Inder Bahl, Gary Lewis and Jon Jorgenson

    Version of Record online : 8 MAR 2007, DOI: 10.1002/mmce.4570010108

  11. Group III nitride core–shell nano- and microrods for optoelectronic applications

    physica status solidi (RRL) - Rapid Research Letters

    Volume 7, Issue 10, October 2013, Pages: 800–814, Martin Mandl, Xue Wang, Tilman Schimpke, Christopher Kölper, Michael Binder, Johannes Ledig, Andreas Waag, Xiang Kong, Achim Trampert, Frank Bertram, Jürgen Christen, Francesca Barbagini, Enrique Calleja and Martin Strassburg

    Version of Record online : 23 JUL 2013, DOI: 10.1002/pssr.201307250

  12. Transistor and Amplifier Measurements

    Fundamentals of RF and Microwave Transistor Amplifiers

    Inder J. Bahl, Pages: 613–636, 2008

    Published Online : 28 OCT 2008, DOI: 10.1002/9780470462348.ch22

  13. Applying line-series-shunt calibration to one-tier on-wafer device de-embedding up to millimeter waves

    Microwave and Optical Technology Letters

    Volume 55, Issue 4, April 2013, Pages: 744–747, Chien-Chang Huang and Yu-Chuan Chen

    Version of Record online : 27 FEB 2013, DOI: 10.1002/mop.27445

  14. Automated electrochemical CV profiling of LED structures on wafer scale

    physica status solidi (c)

    Volume 1, Issue 10, September 2004, Pages: 2417–2420, T. Wolff, M. Rapp and T. Rotter

    Version of Record online : 6 SEP 2004, DOI: 10.1002/pssc.200405080

  15. Modelling of GaAs-MMIC microstrip line up to 40 GHz

    International Journal of RF and Microwave Computer-Aided Engineering

    Volume 14, Issue 5, September 2004, Pages: 475–482, J. P. Thakur, A. K. Pandey, A. Kedar, K. K. Gupta and H. P. Vyas

    Version of Record online : 17 AUG 2004, DOI: 10.1002/mmce.20035

  16. A comparative evaluation of de-embedding methods for on-wafer RF CMOS inductor S-parameter measurements

    physica status solidi (c)

    Volume 5, Issue 12, December 2008, Pages: 3671–3676, M. Drakaki, A. Hatzopoulos and S. Siskos

    Version of Record online : 16 SEP 2008, DOI: 10.1002/pssc.200780148

  17. Applications of artificial neural networks to RF and microwave measurements

    International Journal of RF and Microwave Computer-Aided Engineering

    Volume 12, Issue 1, January 2002, Pages: 3–24, Jeffrey A. Jargon, K. C. Gupta and Donald C. DeGroot

    Version of Record online : 6 DEC 2001, DOI: 10.1002/mmce.10014

  18. Modulation Doped FETs

    Standard Article

    Encyclopedia of RF and Microwave Engineering

    Lianghong Liu and Hadis Morkoç

    Published Online : 15 APR 2005, DOI: 10.1002/0471654507.eme269

  19. Numerical modeling and uncertainty analysis of transistor noise-parameter measurements

    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields

    Volume 28, Issue 6, November/December 2015, Pages: 628–638, James Randa

    Version of Record online : 5 DEC 2014, DOI: 10.1002/jnm.2039

  20. Coplanar to microstrip transitions for on-wafer measurements

    Microwave and Optical Technology Letters

    Volume 49, Issue 1, January 2007, Pages: 100–103, Yi Wang and Michael J. Lancaster

    Version of Record online : 20 NOV 2006, DOI: 10.1002/mop.22056