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There are 1111362 results for: content related to: Ellipsometry from infrared to vacuum ultraviolet: Structural properties of thin anisotropic guanine films on silicon

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  1. Synchrotron infrared spectroscopic ellipsometry for characterization of biofunctional surfaces

    physica status solidi (b)

    Volume 247, Issue 8, August 2010, Pages: 1925–1931, Guoguang Sun, Dana Maria Rosu, Xin Zhang, Marc Hovestädt, Simona Pop, Ulrich Schade, Dennis Aulich, Michael Gensch, Bernhard Ay, Hermann-Georg Holzhütter, Dietrich R. T. Zahn, Norbert Esser, Rudolf Volkmer, Jörg Rappich and Karsten Hinrichs

    Article first published online : 14 JUN 2010, DOI: 10.1002/pssb.200983945

  2. Investigations of Soft Organic Films with Ellipsometry

    Functional Polymer Films: 2 Volume Set

    Wolfgang Knoll, Rigoberto C. Advincula, Pages: 629–647, 2011

    Published Online : 7 JUN 2011, DOI: 10.1002/9783527638482.ch18

  3. Infrared ellipsometry of interdiffusion in thin films of miscible polymers

    Surface and Interface Analysis

    Volume 37, Issue 1, January 2005, Pages: 33–41, P. Duckworth, H. Richardson, C. Carelli and J. L. Keddie

    Article first published online : 10 JAN 2005, DOI: 10.1002/sia.2003

  4. Another century of ellipsometry

    Annalen der Physik

    Volume 15, Issue 7-8, July 2006, Pages: 480–497, M. Schubert

    Article first published online : 24 MAY 2006, DOI: 10.1002/andp.200510204

  5. Comparative study of dielectric functions of complex organic heterostructures

    physica status solidi (b)

    Volume 242, Issue 13, November 2005, Pages: 2688–2695, O. D. Gordan, S. Hermann, M. Friedrich and D. R. T. Zahn

    Article first published online : 19 OCT 2005, DOI: 10.1002/pssb.200541092

  6. Data Analysis Examples

    Spectroscopic Ellipsometry: Principles and Applications

    Hiroyuki Fujiwara, Pages: 249–310, 2007

    Published Online : 19 OCT 2007, DOI: 10.1002/9780470060193.ch7

  7. UV-VIS-IR Ellipsometry (ELL)

    Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications, Second Edition

    Bernd Gruska, Karsten Hinrichs, Pages: 393–405, 2011

    Published Online : 12 APR 2011, DOI: 10.1002/9783527636921.ch25

  8. Principles of Spectroscopic Ellipsometry

    Spectroscopic Ellipsometry: Principles and Applications

    Hiroyuki Fujiwara, Pages: 81–146, 2007

    Published Online : 19 OCT 2007, DOI: 10.1002/9780470060193.ch4

  9. Optical properties of multilayer silicon nitride structures with silicon quantum dots

    physica status solidi (c)

    Volume 8, Issue 9, September 2011, Pages: 2684–2687, Marek Lipiński, Janusz Jaglarz, Agnieszka Chrzanowska and Krzysztof Hejduk

    Article first published online : 26 MAY 2011, DOI: 10.1002/pssc.201084129

  10. Ellipsometry

    Standard Article

    The Optics Encyclopedia

    Robert W. Collins

    Published Online : 15 SEP 2007, DOI: 10.1002/9783527600441.oe020

  11. Ellipsometry

    Standard Article

    Encyclopedia of Applied Physics

    Robert W. Collins

    Published Online : 15 JUL 2004, DOI: 10.1002/3527600434.eap131.pub2

  12. Spectroscopic Ellipsometry for Characterization of Thin Films of Polymer Blends

    Macromolecular Symposia

    Volume 230, Issue 1, December 2005, Pages: 26–32, K. Hinrichs, M. Gensch, N. Nikonenko, J. Pionteck and K.-J. Eichhorn

    Article first published online : 12 DEC 2005, DOI: 10.1002/masy.200551138

  13. Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study

    Surface and Interface Analysis

    Volume 36, Issue 9, September 2004, Pages: 1269–1303, M. P. Seah, S. J. Spencer, F. Bensebaa, I. Vickridge, H. Danzebrink, M. Krumrey, T. Gross, W. Oesterle, E. Wendler, B. Rheinländer, Y. Azuma, I. Kojima, N. Suzuki, M. Suzuki, S. Tanuma, D. W. Moon, H. J. Lee, Hyun Mo Cho, H. Y. Chen, A. T. S. Wee, T. Osipowicz, J. S. Pan, W. A. Jordaan, R. Hauert, U. Klotz, C. van der Marel, M. Verheijen, Y. Tamminga, C. Jeynes, P. Bailey, S. Biswas, U. Falke, N. V. Nguyen, D. Chandler-Horowitz, J. R. Ehrstein, D. Muller and J. A. Dura

    Article first published online : 1 SEP 2004, DOI: 10.1002/sia.1909

  14. Dielectric modeling of transmittance and ellipsometric spectra of thin In2O3:Sn films

    physica status solidi (a)

    Volume 207, Issue 7, July 2010, Pages: 1543–1548, Zhaohui Qiao and Dieter Mergel

    Article first published online : 31 MAY 2010, DOI: 10.1002/pssa.200983710

  15. Phonons and free-carrier properties of binary, ternary, and quaternary group-III nitride layers measured by Infrared Spectroscopic Ellipsometry

    physica status solidi (c)

    Volume 0, Issue 6, September 2003, Pages: 1750–1769, A. Kasic, M. Schubert, J. Off, B. Kuhn, F. Scholz, S. Einfeldt, T. Böttcher, D. Hommel, D. J. As, U. Köhler, A. Dadgar, A. Krost, Y. Saito, Y. Nanishi, M. R. Correia, S. Pereira, V. Darakchieva, B. Monemar, H. Amano, I. Akasaki and G. Wagner

    Article first published online : 27 AUG 2003, DOI: 10.1002/pssc.200303135

  16. Infrared Spectroscopic Ellipsometry

    Standard Article

    Handbook of Vibrational Spectroscopy

    Arnulf Röseler and Ernst-Heiner Korte

    Published Online : 15 AUG 2006, DOI: 10.1002/0470027320.s2208

  17. Comparative characterisation by atomic force microscopy and ellipsometry of soft and solid thin films

    Surface and Interface Analysis

    Volume 39, Issue 7, July 2007, Pages: 575–581, T. A. Mykhaylyk, N. L. Dmitruk, S. D. Evans, I. W. Hamley and J. R. Henderson

    Article first published online : 30 APR 2007, DOI: 10.1002/sia.2566

  18. Spectroscopic ellipsometry and reflectance anisotropy spectroscopy of biomolecular layers on silicon surfaces

    physica status solidi (b)

    Volume 242, Issue 13, November 2005, Pages: 2671–2680, Dietrich R. T. Zahn, Simona D. Silaghi, Christoph Cobet, Marion Friedrich and Norbert Esser

    Article first published online : 19 OCT 2005, DOI: 10.1002/pssb.200541096

  19. Nondestructive Evaluation of Critical Properties of Thin Porous Films

    Porous Polymers

    Mikhail R. Baklanov, Denis Shamiryan, Pages: 205–245, 2011

    Published Online : 25 JAN 2011, DOI: 10.1002/9780470929445.ch6

  20. On the Characterization of Silicon Dioxide and Silicon Nitride by Spectroscopic Ellipsometry in the VIS and IR Regions

    physica status solidi (a)

    Volume 124, Issue 2, 16 April 1991, Pages: 547–555, J.-Th. Zettler, M. Weidner and A. Röseler

    Article first published online : 15 FEB 2006, DOI: 10.1002/pssa.2211240222

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