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There are 3812 results for: content related to: Electronic and morphological properties of the electrochemically prepared step bunched silicon (111) surface

  1. Kelvin probe force microscopy in the presence of intrinsic local electric fields

    physica status solidi (a)

    Volume 208, Issue 4, April 2011, Pages: 777–789, Christine Baumgart, Anne-Dorothea Müller, Falk Müller and Heidemarie Schmidt

    Version of Record online : 12 JAN 2011, DOI: 10.1002/pssa.201026251

  2. Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods

    Advanced Materials

    Volume 23, Issue 4, January 25, 2011, Pages: 477–501, Clemens Barth, Adam S. Foster, Claude R. Henry and Alexander L. Shluger

    Version of Record online : 11 NOV 2010, DOI: 10.1002/adma.201002270

  3. Nanoscale Structural and Electronic Properties of Ultrathin Blends of Two Polyaromatic Molecules: A Kelvin Probe Force Microscopy Investigation

    ChemPhysChem

    Volume 7, Issue 4, April 10, 2006, Pages: 847–853, Vincenzo Palermo, Susanna Morelli, Matteo Palma, Christopher Simpson, Fabian Nolde, Andreas Herrmann, Klaus Müllen and Paolo Samorì

    Version of Record online : 10 MAR 2006, DOI: 10.1002/cphc.200500480

  4. Local Surface Potential of π-Conjugated Nanostructures by Kelvin Probe Force Microscopy: Effect of the Sampling Depth

    Small

    Volume 7, Issue 5, March 7, 2011, Pages: 634–639, Andrea Liscio, Vincenzo Palermo, Oliver Fenwick, Slawomir Braun, Klaus Müllen, Mats Fahlman, Franco Cacialli and Paolo Samorí

    Version of Record online : 31 JAN 2011, DOI: 10.1002/smll.201001770

  5. Electrostatic Force Microscopy And Kelvin Probe Force Microscopy

    Standard Article

    Characterization of Materials

    Sascha Sadewasser and Clemens Barth

    Published Online : 12 OCT 2012, DOI: 10.1002/0471266965.com152

  6. Potential profile evaluation of a diamond lateral p–n junction diode using Kelvin probe force microscopy

    physica status solidi (a)

    Volume 212, Issue 11, November 2015, Pages: 2589–2594, Kazuya Shirota, Daisuke Takeuchi, Hiromitsu Kato, Toshiharu Makino, Masahiko Ogura, Hideyo Okushi and Satoshi Yamasaki

    Version of Record online : 16 SEP 2015, DOI: 10.1002/pssa.201532251

  7. Nanoimaging of Open-Circuit Voltage in Photovoltaic Devices

    Advanced Energy Materials

    Volume 5, Issue 23, December 9, 2015, Elizabeth M. Tennyson, Joseph L. Garrett, Jesse A. Frantz, Jason D. Myers, Robel Y. Bekele, Jasbinder S. Sanghera, Jeremy N. Munday and Marina S. Leite

    Version of Record online : 24 SEP 2015, DOI: 10.1002/aenm.201501142

  8. Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy

    Advanced Materials

    Volume 18, Issue 2, January, 2006, Pages: 145–164, V. Palermo, M. Palma and P. Samorì

    Version of Record online : 8 DEC 2005, DOI: 10.1002/adma.200501394

  9. Surface potential measurement of As-doped homojunction ZnO nanorods by Kelvin probe force microscopy

    Surface and Interface Analysis

    Volume 44, Issue 6, June 2012, Pages: 755–758, Chu Van Ben, Hak Dong Cho, Tae Won Kang and Woochul Yang

    Version of Record online : 27 DEC 2011, DOI: 10.1002/sia.3867

  10. Quantitative Measurement of the Local Surface Potential of π-Conjugated Nanostructures: A Kelvin Probe Force Microscopy Study

    Advanced Functional Materials

    Volume 16, Issue 11, July, 2006, Pages: 1407–1416, A. Liscio, V. Palermo, D. Gentilini, F. Nolde, K. Müllen and P. Samorì

    Version of Record online : 14 JUN 2006, DOI: 10.1002/adfm.200600145

  11. Development of an improved Kelvin probe force microscope for accurate local potential measurements on biased electronic devices

    Journal of Microscopy

    Volume 267, Issue 3, September 2017, Pages: 272–279, N.B. BERCU, L. GIRAUDET, O. SIMONETTI and M. MOLINARI

    Version of Record online : 10 APR 2017, DOI: 10.1111/jmi.12563

  12. Other Scanning Probe Microscopies

    Standard Article

    Encyclopedia of Physical Organic Chemistry

    Yuanmin Du, Swee Liang Wong, Johnny Ping Kwan Wong, Yuli Huang and Andrew Thye Shen Wee

    Published Online : 9 APR 2017, DOI: 10.1002/9781118468586.epoc4034

  13. Molecular Assemblies on Insulating Ultrathin Films Analyzed by NC-AFM and KPFM

    Israel Journal of Chemistry

    Volume 48, Issue 2, October 2008, Pages: 107–116, Thilo Glatzel, Lars Zimmerli and Ernst Meyer

    Version of Record online : 10 MAR 2010, DOI: 10.1560/IJC.48.2.107

  14. Local Electrochemical Functionality in Energy Storage Materials and Devices by Scanning Probe Microscopies: Status and Perspectives

    Advanced Materials

    Volume 22, Issue 35, September 15, 2010, Pages: E193–E209, Sergei V. Kalinin and Nina Balke

    Version of Record online : 20 AUG 2010, DOI: 10.1002/adma.201001190

  15. Scanning Probe Microscopy beyond Imaging: A General Tool for Quantitative Analysis

    ChemPhysChem

    Volume 14, Issue 6, April 15, 2013, Pages: 1283–1292, Dr. Andrea Liscio

    Version of Record online : 22 FEB 2013, DOI: 10.1002/cphc.201200880

  16. Improving charge transport in poly(3-hexylthiophene) transistors via blending with an alkyl-substituted phenylene–thiophene–thiophene–phenylene molecule

    Journal of Polymer Science Part B: Polymer Physics

    Volume 50, Issue 9, 1 May 2012, Pages: 642–649, Andrea Liscio, Massimo Bonini, Emanuele Treossi, Emanuele Orgiu, Marcel Kastler, Florian Dötz, Vincenzo Palermo and Paolo Samorì

    Version of Record online : 5 FEB 2012, DOI: 10.1002/polb.23044

  17. Measuring surface state density and energy distribution in InAs nanowires

    physica status solidi (a)

    Volume 211, Issue 2, February 2014, Pages: 473–482, Eliezer Halpern, Gilad Cohen, Shahar Gross, Alexander Henning, Max Matok, Andrey V. Kretinin, Hadas Shtrikman and Yossi Rosenwaks

    Version of Record online : 28 JAN 2014, DOI: 10.1002/pssa.201300302

  18. Bottom-Up Fabricated Asymmetric Electrodes for Organic Electronics

    Advanced Materials

    Volume 22, Issue 44, November 24, 2010, Pages: 5018–5023, Andrea Liscio, Emanuele Orgiu, Jeffrey M. Mativetsky, Vincenzo Palermo and Paolo Samorì

    Version of Record online : 31 AUG 2010, DOI: 10.1002/adma.201002215

  19. Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy

    Scanning Probe Microscopies Beyond Imaging: Manipulation of Molecules and Nanostructures

    Vincenzo Palermo, Matteo Palma, Paolo Samorì, Pages: 390–429, 2006

    Published Online : 29 JUN 2006, DOI: 10.1002/3527608516.ch13

  20. Probing Local Surface Potential of Quasi-One-Dimensional Systems: A KPFM Study of P3HT Nanofibers

    Advanced Functional Materials

    Volume 18, Issue 6, March 25, 2008, Pages: 907–914, Andrea Liscio, Vincenzo Palermo and Paolo Samorı`

    Version of Record online : 18 MAR 2008, DOI: 10.1002/adfm.200701142