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There are 7865124 results for: content related to: Impedance spectroscopy of polysilicon in SOI structures

  1. Numerical simulation of multiple polysilicon CVD reactors connected in series using CFD method

    The Canadian Journal of Chemical Engineering

    Volume 93, Issue 10, October 2015, Pages: 1721–1729, Zheqing Huang, Siyuan Qie, Xiaoyu Quan, Kai Guo and Chunjiang Liu

    Version of Record online : 6 AUG 2015, DOI: 10.1002/cjce.22263

  2. 4-kV 100-Mbps monolithic isolator on SOI with trench isolation for wideband networks

    IEEJ Transactions on Electrical and Electronic Engineering

    Volume 8, Issue 6, November 2013, Pages: 603–609, Takayuki Hashimoto, Seigo Yukutake, Nobuyasu Kanekawa, Yusuke Takeuchi, Atsuo Watanabe and Noboru Akiyama

    Version of Record online : 18 SEP 2013, DOI: 10.1002/tee.21903

  3. Silicon, Polycrystalline

    Standard Article

    Encyclopedia of Applied Physics

    Maurizio Arienzo and Wendy A. Orr-Arienzo

    Published Online : 15 APR 2003, DOI: 10.1002/3527600434.eap436

  4. Electrical properties of polysilicon nanowires for device applications

    physica status solidi (c)

    Volume 8, Issue 3, March 2011, Pages: 827–830, F. Demami, R. Rogel, A.-C. Salaün and L. Pichon

    Version of Record online : 17 DEC 2010, DOI: 10.1002/pssc.201000227

  5. Polysilicon Emitters

    SiGe Heterojunction Bipolar Transistors

    Peter Ashburn, Pages: 93–120, 2004

    Published Online : 16 JAN 2004, DOI: 10.1002/047009074X.ch6

  6. The influence of an OTS self-assembled monolayer on the wear-resistant properties of polysilicon based MEMS

    Surface and Interface Analysis

    Volume 38, Issue 4, April 2006, Pages: 863–867, M. A. Baker and J. Li

    Version of Record online : 29 MAR 2006, DOI: 10.1002/sia.2210

  7. Minority carrier transport equation for bipolar transistors with polysilicon emitter contact

    physica status solidi (a)

    Volume 196, Issue 2, April 2003, Pages: 436–449, Abdelaziz Zouari and Adel Ben Arab

    Version of Record online : 25 MAR 2003, DOI: 10.1002/pssa.200305955

  8. Solar Grade Silicon Feedstock

    Handbook of Photovoltaic Science and Engineering, Second Edition

    Bruno Ceccaroli, Otto Lohne, Pages: 169–217, 2011

    Published Online : 1 MAR 2011, DOI: 10.1002/9780470974704.ch5

  9. New advances in polysilicon processes correlating feedstock properties and good crystal and wafer performances

    physica status solidi (c)

    Volume 9, Issue 10-11, October 2012, Pages: 2062–2070, Bruno Ceccaroli, Otto Lohne and Eivind J. Øvrelid

    Version of Record online : 25 SEP 2012, DOI: 10.1002/pssc.201100167

  10. Interface analysis in polysilicon thin films and poly-Si/SiO2 systems

    Surface and Interface Analysis

    Volume 18, Issue 10, October 1992, Pages: 709–712, N. G. Nakhodkin and T. V. Rodionova

    Version of Record online : 15 SEP 2004, DOI: 10.1002/sia.740181004

  11. Porous silicon/polysilicon for improved sensitivity pressure sensors

    physica status solidi (c)

    Volume 6, Issue 7, July 2009, Pages: 1759–1762, L. Sujatha and Enakshi Bhattacharya

    Version of Record online : 9 FEB 2009, DOI: 10.1002/pssc.200881070

  12. 3D Memory Using Double-Gate, Folded, TFT, and Stacked Crystal Silicon

    Vertical 3D Memory Technologies

    Betty Prince, Pages: 25–71, 2014

    Published Online : 25 JUL 2014, DOI: 10.1002/9781118760475.ch02

  13. Gettering of iron in CZ-silicon by polysilicon layer

    physica status solidi (c)

    Volume 8, Issue 3, March 2011, Pages: 751–754, A. Haarahiltunen, M. Yli-Koski, H. Talvitie, V. Vähänissi, J. Lindroos and H. Savin

    Version of Record online : 23 NOV 2010, DOI: 10.1002/pssc.201000194

  14. Semiconductor optical fibres: progress and opportunities

    Laser & Photonics Reviews

    Volume 8, Issue 1, January 2014, Pages: 53–72, Anna C. Peacock, Justin R. Sparks and Noel Healy

    Version of Record online : 25 APR 2013, DOI: 10.1002/lpor.201300016

  15. Formation of different types of polysilicon film structures and their grain growth under annealing

    physica status solidi (a)

    Volume 123, Issue 2, 16 February 1991, Pages: 431–439, N. G. Nakhodkin and T. V. Rodionova

    Version of Record online : 15 FEB 2006, DOI: 10.1002/pssa.2211230208

  16. On the silicon dioxide/polycrystalline silicon interface width measurement

    Surface and Interface Analysis

    Volume 13, Issue 4, December 1988, Pages: 202–208, G. Queirolo, S. Manzini, L. Meda, M. Anderle, R. Canteri, A. Armigliato and S. Frabboni

    Version of Record online : 15 SEP 2004, DOI: 10.1002/sia.740130406

  17. Iron segregation in silicon-on-insulator wafer with polysilicon interlayer

    physica status solidi (a)

    Volume 209, Issue 4, April 2012, Pages: 724–726, M. Yli-Koski, A. Haarahiltunen, J. Hintsala and H. Savin

    Version of Record online : 13 FEB 2012, DOI: 10.1002/pssa.201127718

  18. A study of the surface chemistry, morphology and wear of silicon based MEMS

    Surface and Interface Analysis

    Volume 36, Issue 8, August 2004, Pages: 1254–1258, J. Li, Z. Cui and M. A. Baker

    Version of Record online : 12 AUG 2004, DOI: 10.1002/sia.1888

  19. Microtechnologies and Micromanipulation

    Microrobotics for Micromanipulation

    Nicolas Chaillet, Stéphane Régnier, Pages: 335–368, 2013

    Published Online : 7 MAR 2013, DOI: 10.1002/9781118622810.ch5

  20. Silicon nitride/silicon oxide interlayers for solar cell passivating contacts based on PECVD amorphous silicon

    physica status solidi (RRL) - Rapid Research Letters

    Volume 9, Issue 11, November 2015, Pages: 617–621, Di Yan, Andres Cuevas, Yimao Wan and James Bullock

    Version of Record online : 8 OCT 2015, DOI: 10.1002/pssr.201510325