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There are 35190 results for: content related to: Low temperature plasma oxidation for advanced 3D CMOS-based devices

  1. Angle-resolved XPS studies of oxides at NbN, NbC, and Nb surfaces

    Surface and Interface Analysis

    Volume 10, Issue 5, June 1987, Pages: 223–237, A. Darlinski and J. Halbritter

    Version of Record online : 15 SEP 2004, DOI: 10.1002/sia.740100502

  2. Oxidation studies of Au-Al alloys using x-ray photoelectron spectroscopy (XPS) and x-ray absorption near-edge structure (XANES)

    Surface and Interface Analysis

    Volume 31, Issue 9, September 2001, Pages: 874–880, H. Piao and N. S. McIntyre

    Version of Record online : 30 AUG 2001, DOI: 10.1002/sia.1123

  3. Ultrasound-assisted oxidation of tungsten in oxygen plasma: the early stages of the oxide film growth

    Surface and Interface Analysis

    Volume 38, Issue 8, August 2006, Pages: 1242–1246, Andriy Romanyuk, Roland Steiner, Viktor Melnik and Verena Thommen

    Version of Record online : 19 JUN 2006, DOI: 10.1002/sia.2386

  4. On the determination of Oxide Formation Rate for tantalum in chromate bath from cell voltage

    Materialwissenschaft und Werkstofftechnik

    Volume 12, Issue 3, März 1981, Pages: 84–87, Prof. I. A. Ammar and R. El Kasimi

    Version of Record online : 15 SEP 2004, DOI: 10.1002/mawe.19810120303

  5. DNA damage in peripheral blood leukocytes of physically active individuals as measured by the alkaline single cell gel electrophoresis assay

    Environmental and Molecular Mutagenesis

    Volume 50, Issue 4, May 2009, Pages: 291–303, Gursatej Gandhi and Gunjan Chopra

    Version of Record online : 28 JAN 2009, DOI: 10.1002/em.20457

  6. On the Kinetics of the Anodic Oxidation of GaP

    Berichte der Bunsengesellschaft für physikalische Chemie

    Volume 99, Issue 12, Dezember 1995, Pages: 1514–1520, K.-H. Heckner, G. Majoros, A. Kraft and R. Landsberg

    Version of Record online : 18 MAR 2014, DOI: 10.1002/bbpc.199500117

  7. Attempts to find a correlation between the GaAs plasma oxide growth conditions and the charge DLTS response of interface states

    physica status solidi (a)

    Volume 99, Issue 2, 16 February 1987, Pages: K91–K95, I. Thurzo and E. Pinčík

    Version of Record online : 16 FEB 2006, DOI: 10.1002/pssa.2210990244

  8. Silicon Device Processing

    Handbook of Semiconductor Technology Set

    Kenneth A. Jackson, Wolfgang Schröter, Pages: 407–487, 2008

    Published Online : 4 JUN 2008, DOI: 10.1002/9783527619290.ch9a

  9. Fabrication of SiO2 thin films by ECR plasma anodization

    Electronics and Communications in Japan (Part II: Electronics)

    Volume 74, Issue 5, 1991, Pages: 49–59, Koki Matsumura

    Version of Record online : 23 MAR 2007, DOI: 10.1002/ecjb.4420740506

  10. Galvanostatic formation of barrier-type Anodic oxides

    Materialwissenschaft und Werkstofftechnik

    Volume 12, Issue 9, September 1981, Pages: 309–315, Prof. Dr. I. A. Ammar, S. Darwish and M. W. Khalil

    Version of Record online : 15 SEP 2004, DOI: 10.1002/mawe.19810120904

  11. Ellipsometric Investigation of the Kinetics of Native Oxide Growth on Aluminium and Argon Implanted GaAs

    physica status solidi (a)

    Volume 112, Issue 2, 16 April 1989, Pages: 789–792, M. Kulik and J. Żuk

    Version of Record online : 15 FEB 2006, DOI: 10.1002/pssa.2211120245

  12. A Review of the Integration of Science and Mathematics: Implications for Further Research

    School Science and Mathematics

    Volume 100, Issue 2, February 2000, Pages: 73–82, JeongSuk Pang and Ron Good

    Version of Record online : 17 MAR 2010, DOI: 10.1111/j.1949-8594.2000.tb17239.x

  13. Crystalline Oxides on Silicon

    Advanced Materials

    Volume 22, Issue 26-27, July 20, 2010, Pages: 2919–2938, James W. Reiner, Alexie M. Kolpak, Yaron Segal, Kevin F. Garrity, Sohrab Ismail-Beigi, Charles H. Ahn and Fred J. Walker

    Version of Record online : 28 APR 2010, DOI: 10.1002/adma.200904306

  14. Investigation of native oxide growth on zinc in different atmospheres by spectroscopic ellipsometry

    physica status solidi (a)

    Volume 209, Issue 5, May 2012, Pages: 846–853, Ying Chen, Paul Schneider and Andreas Erbe

    Version of Record online : 29 MAR 2012, DOI: 10.1002/pssa.201100542

  15. Silicon Device Processing

    Handbook of Semiconductor Technology: Processing of Semiconductors, Volume 2

    Kenneth A. Jackson, Wolfgang Schröter, Pages: 407–487, 2008

    Published Online : 28 MAY 2008, DOI: 10.1002/9783527621828.ch9

  16. A Teacher's Journey with a New Generation Handheld: Decisions, Struggles, and Accomplishments

    School Science and Mathematics

    Volume 111, Issue 5, May 2011, Pages: 209–224, S. Aslı Özgün-Koca, Michael Meagher and Michael Todd Edwards

    Version of Record online : 2 MAY 2011, DOI: 10.1111/j.1949-8594.2011.00080.x

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    Late stage oxide growth associated with hydrothermal alteration of the Western Granite, Isle of Rum, NW Scotland

    Geochemistry, Geophysics, Geosystems

    Volume 12, Issue 1, January 2011, M. S. Petronis, B. O'Driscoll and J. Lindline

    Version of Record online : 6 JAN 2011, DOI: 10.1029/2010GC003246

  18. Some properties of MIS structures prepared by plasma oxidation of Al layers on GaAs

    physica status solidi (a)

    Volume 106, Issue 2, 16 April 1988, Pages: 659–667, E. Pinčíak, B. Maťátko, J. Bartoš, I. Thurzo, M. Geendel, V. Nádaždy, M. Zubeková and M. Morvic

    Version of Record online : 15 FEB 2006, DOI: 10.1002/pssa.2211060239

  19. Surface Patterning by Local Plasma Jet Sacrificial Oxidation of Silicon

    Plasma Processes and Polymers

    Volume 10, Issue 5, May 2013, Pages: 416–421, Hendrik Paetzelt, Thomas Arnold, Georg Böhm, Fred Pietag and Axel Schindler

    Version of Record online : 4 MAR 2013, DOI: 10.1002/ppap.201200099

  20. Corrosion behaviour of zirconium electrode in sodium azide electrolyte as compared to the alkali halide solutions

    Materials and Corrosion

    Volume 55, Issue 8, August 2004, Pages: 617–622, A. A. Ghoneim

    Version of Record online : 2 AUG 2004, DOI: 10.1002/maco.200303780