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There are 17430 results for: content related to: Inter-laboratory comparison: Quantitative surface analysis of thin Fe-Ni alloy films

  1. Encoding of stoichiometric constraints in the composition depth profile reconstruction from angle resolved X-ray photoelectron spectroscopy data

    Surface and Interface Analysis

    Volume 43, Issue 13, December 2011, Pages: 1581–1604, Karol Macak

    Version of Record online : 13 APR 2011, DOI: 10.1002/sia.3753

  2. Topography effects and monatomic ion sputtering of undulating surfaces, particles and large nanoparticles: Sputtering yields, effective sputter rates and topography evolution

    Surface and Interface Analysis

    Volume 44, Issue 2, February 2012, Pages: 208–218, M. P. Seah

    Version of Record online : 16 JUN 2011, DOI: 10.1002/sia.3798

  3. The density of interface states and their relaxation times in Au/Bi4Ti3O12/SiO2/n-Si(MFIS) structures

    Surface and Interface Analysis

    Volume 43, Issue 13, December 2011, Pages: 1561–1565, M. M. Bülbül, Ş. Altındal, F. Parlaktürk and A. Tataroğlu

    Version of Record online : 24 FEB 2011, DOI: 10.1002/sia.3749

  4. Effect of oxidized silicon (SiOx) surfaces functionalization on real-time PCR by Lab-on-a-chip microdevices

    Surface and Interface Analysis

    Volume 43, Issue 12, December 2011, Pages: 1498–1508, Raffaella Suriano, Jasmin Hume, Marco Cereda, Marco De Fazio, Marco Bianchessi, Marinella Levi and Stefano Turri

    Version of Record online : 10 FEB 2011, DOI: 10.1002/sia.3744

  5. Investigation on surface activity of cyclodextrins grafting cellulose beads through phenolphthalein probe molecule

    Surface and Interface Analysis

    Volume 43, Issue 12, December 2011, Pages: 1532–1538, Ting Wang, Bin Li, Hongyan Si and Li Lin

    Version of Record online : 10 FEB 2011, DOI: 10.1002/sia.3748

  6. Mechanical properties of hydrogenated nanocrystalline silicon thin film with different indentation depths

    Surface and Interface Analysis

    Volume 44, Issue 3, March 2012, Pages: 265–269, Liqiang Guo, Jianning Ding, Jichang Yang, Guanggui Cheng and Zhiyong Ling

    Version of Record online : 28 JUN 2011, DOI: 10.1002/sia.3790

  7. Modeling of PEG grafting and prediction of interfacial force profile using X-ray photoelectron spectroscopy

    Surface and Interface Analysis

    Volume 44, Issue 2, February 2012, Pages: 144–149, Vinod B. Damodaran, Conan J. Fee and Ketul C. Popat

    Version of Record online : 23 MAY 2011, DOI: 10.1002/sia.3783

  8. Thickness determination of thin anodic titanium oxide films—a comparison between coulometry and reflectometry

    Surface and Interface Analysis

    Volume 43, Issue 12, December 2011, Pages: 1471–1479, M. Schneider, U. Langklotz and A. Michaelis

    Version of Record online : 10 FEB 2011, DOI: 10.1002/sia.3736

  9. Quantitative surface analysis of Fe[BOND]Ni alloy films by XPS, AES and SIMS

    Surface and Interface Analysis

    Volume 39, Issue 8, August 2007, Pages: 665–673, K. J. Kim, D. W. Moon, C. J. Park, D. Simons, G. Gillen, H. Jin and H. J. Kang

    Version of Record online : 21 MAY 2007, DOI: 10.1002/sia.2575

  10. Improved Tougaard background calculation by introduction of fittable parameters for the inelastic electron scattering cross-section in the peak fit of photoelectron spectra with UNIFIT 2011

    Surface and Interface Analysis

    Volume 43, Issue 12, December 2011, Pages: 1514–1526, R. Hesse and R. Denecke

    Version of Record online : 24 FEB 2011, DOI: 10.1002/sia.3746

  11. Simple statistically based alternatives to MAF for ToF-SIMS spectral image analysis

    Surface and Interface Analysis

    Volume 43, Issue 13, December 2011, Pages: 1616–1626, Michael R. Keenan and Vincent S. Smentkowski

    Version of Record online : 25 MAR 2011, DOI: 10.1002/sia.3757

  12. Energy dispersive electron probe microanalysis (ED-EPMA) of elemental composition and thickness of Fe-Ni alloy films

    Surface and Interface Analysis

    Volume 44, Issue 11-12, November-December 2012, Pages: 1459–1461, Vasile-Dan Hodoroaba, Kyung Joong Kim and Wolfgang E. S. Unger

    Version of Record online : 17 APR 2012, DOI: 10.1002/sia.4975

  13. Elastic properties of chemically modified baker's yeast cells studied by AFM

    Surface and Interface Analysis

    Volume 43, Issue 13, December 2011, Pages: 1636–1640, Arturas Suchodolskis, Vidmantas Feiza, Arunas Stirke, Ana Timonina, Almira Ramanaviciene and Arunas Ramanavicius

    Version of Record online : 5 APR 2011, DOI: 10.1002/sia.3763

  14. Round-robin test for the measurement of layer thickness of multilayer films by secondary ion mass spectrometry depth profiling

    Surface and Interface Analysis

    Volume 49, Issue 11, November 2017, Pages: 1057–1063, Kyung Joong Kim, Jong Shik Jang, Joe Bennett, David Simons, Mario Barozzi, Akio Takano, Zhanping Li and Charles Magee

    Version of Record online : 27 JUL 2017, DOI: 10.1002/sia.6277

  15. Study of the structural and atomic diffusive properties of the ordered Cu3Au (110) surface

    Surface and Interface Analysis

    Volume 43, Issue 12, December 2011, Pages: 1486–1490, Yan-Ni Wen, Yan Zhang, Jian-Min Zhang and Ke-Wei Xu

    Version of Record online : 26 JAN 2011, DOI: 10.1002/sia.3738

  16. Selective response of antigen-antibody reactions on chiral surfaces modified with 1,2-diphenylethylenediamine enantiomers

    Surface and Interface Analysis

    Volume 44, Issue 2, February 2012, Pages: 170–174, Juan Zhou, Lilan Wang, Qiao Chen, Yonghua Wang and Yingzi Fu

    Version of Record online : 31 MAY 2011, DOI: 10.1002/sia.3789

  17. 60.4: Single Layer Al-Ni Interconnections for TFT-LCDs using Direct Contacts with ITO and a-Si

    SID Symposium Digest of Technical Papers

    Volume 38, Issue 1, May 2007, Pages: 1713–1716, Toshihiro Kugimiya, Yoichiro Yoneda, Kazuo Yoshikawa, Hiroshi Gotoh and Nobuyuki Kawakami

    Version of Record online : 5 JUL 2012, DOI: 10.1889/1.2785656

  18. Flow electroanalysis of metal alloy films: Application to the compositional assay of Copper-Nickel alloys

    Electroanalysis

    Volume 8, Issue 12, December 1996, Pages: 1140–1144, Mai Zhou, Noseung Myung and Krishnan Rajeshwar

    Version of Record online : 25 APR 2005, DOI: 10.1002/elan.1140081213

  19. Detection limits in XPS for more than 6000 binary systems using Al and Mg Kα X-rays

    Surface and Interface Analysis

    Volume 46, Issue 3, March 2014, Pages: 175–185, Alexander G. Shard

    Version of Record online : 3 FEB 2014, DOI: 10.1002/sia.5406

  20. Electronic and adsorption properties of Ce-Ag layers

    Surface and Interface Analysis

    Volume 43, Issue 12, December 2011, Pages: 1539–1542, Miloš Cabala, Kateřina Veltruská and Vladimír Matolín

    Version of Record online : 16 MAR 2011, DOI: 10.1002/sia.3751