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There are 30699 results for: content related to: Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis

  1. Quantitative AES IX and quantitative XPS II: Auger and x-ray photoelectron intensities and sensitivity factors from spectral digital databases reanalysed using a REELS database

    Surface and Interface Analysis

    Volume 31, Issue 8, August 2001, Pages: 778–795, M. P. Seah, I. S. Gilmore and S. J. Spencer

    Version of Record online : 2 AUG 2001, DOI: 10.1002/sia.1109

  2. An alternative to the relative sensitivity factor approach to quantitative SIMS analysis

    Surface and Interface Analysis

    Volume 2, Issue 4, August 1980, Pages: 123–133, A. E. Morgan

    Version of Record online : 15 SEP 2004, DOI: 10.1002/sia.740020402

  3. The reliability of quantitative analysis with AES

    Surface and Interface Analysis

    Volume 16, Issue 1-12, July 1990, Pages: 140–143, K. Yoshihara, R. Shimizu, T. Homma, H. Tokutaka, K. Goto, D. Fujita, A. Kurokawa, S. Ichimura, M. Kurahashi, M. Kudo, Y. Hashiguchi, T. Suzuki, T. Ohmura, F. Soeda, K. Tanaka, A. Tanaka, T. Sekine, Y. Shiokawa and T. Hayashi

    Version of Record online : 15 SEP 2004, DOI: 10.1002/sia.740160127

  4. Data compilations: their use to improve measurement certainty in surface analysis by aes and xps

    Surface and Interface Analysis

    Volume 9, Issue 2, July 1986, Pages: 85–98, M. P. Seah

    Version of Record online : 15 SEP 2004, DOI: 10.1002/sia.740090203

  5. An empirical electron spectrometer transmission function for applications in quantitative XPS

    Surface and Interface Analysis

    Volume 15, Issue 5, May 1990, Pages: 323–327, Carol S. Hemminger, Terry A. Land, Alex Christie and John C. Hemminger

    Version of Record online : 15 SEP 2004, DOI: 10.1002/sia.740150505

  6. Quantitation of coverages on rough surfaces by XPS: An overview

    Surface and Interface Analysis

    Volume 13, Issue 4, December 1988, Pages: 186–192, Julia E. Fulghum and Richard W. Linton

    Version of Record online : 15 SEP 2004, DOI: 10.1002/sia.740130404

  7. An investigation of cloud/radiation interactions using three-dimensional nephanalysis and earth radiation budget data bases

    Journal of Geophysical Research: Atmospheres (1984–2012)

    Volume 92, Issue D5, 20 May 1987, Pages: 5540–5554, George Koenig, Kuo-Nan Liou, Michael Griffin

    Version of Record online : 21 SEP 2012, DOI: 10.1029/JD092iD05p05540

  8. A comparison of experimental and theoretically derived sensitivity factors for XPS

    Surface and Interface Analysis

    Volume 18, Issue 9, September 1992, Pages: 679–684, R. J. Ward and B. J. Wood

    Version of Record online : 15 SEP 2004, DOI: 10.1002/sia.740180908

  9. Quantitative determination of the composition of nitrided layers on iron using AES

    Surface and Interface Analysis

    Volume 39, Issue 6, June 2007, Pages: 519–527, I. Vandendael, W. G. Sloof, O. Steenhaut, A. Hubin and J. Vereecken

    Version of Record online : 23 FEB 2007, DOI: 10.1002/sia.2551

  10. Methods for quantitative analysis in secondary ion mass spectrometry

    Scanning

    Volume 3, Issue 2, 1980, Pages: 110–118, Dale E. Newbury

    Version of Record online : 9 AUG 2011, DOI: 10.1002/sca.4950030206

  11. Distribution analysis of carbon and sulphur in CVD-Al2O3-layers by SIMS using Cs+ primary ions

    Surface and Interface Analysis

    Volume 8, Issue 4, August 1986, Pages: 159–165, P. Wilhartitz, M. Grasserbauer, H. Altena and B. Lux

    Version of Record online : 15 SEP 2004, DOI: 10.1002/sia.740080404

  12. Practical peak area measurements in X-ray photoelectron spectroscopy

    Surface and Interface Analysis

    Volume 3, Issue 6, December 1981, Pages: 272–274, H. E. Bishop

    Version of Record online : 15 SEP 2004, DOI: 10.1002/sia.740030608

  13. You have free access to this content
    Experimental measurement of, and controls on, permeability and permeability anisotropy of caprocks from the CO2 storage project at the Krechba Field, Algeria

    Journal of Geophysical Research: Solid Earth (1978–2012)

    Volume 116, Issue B12, December 2011, P. J. Armitage, D. R. Faulkner, R. H. Worden, A. C. Aplin, A. R. Butcher and J. Iliffe

    Version of Record online : 28 DEC 2011, DOI: 10.1029/2011JB008385

  14. Characterization by XPS and AES of oxide films formed on stainless steel 304 under various PWR conditions

    Surface and Interface Analysis

    Volume 12, Issue 7, July 1988, Pages: 412–418, S. B. Couling and L. S. Welch

    Version of Record online : 15 SEP 2004, DOI: 10.1002/sia.740120709

  15. Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 – Surface chemical analysis – Auger electron spectroscopy and X-ray photoelectron spectroscopy – Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

    Surface and Interface Analysis

    Volume 38, Issue 3, March 2006, Pages: 178–180, S. Tanuma

    Version of Record online : 28 DEC 2005, DOI: 10.1002/sia.2177

  16. Evaluation of uncertainties in X-ray photoelectron spectroscopy intensities associated with different methods and procedures for background subtraction. II. Spectra for unmonochromated Al and Mg X-rays

    Surface and Interface Analysis

    Volume 41, Issue 10, October 2009, Pages: 804–813, C. J. Powell and J. M. Conny

    Version of Record online : 25 AUG 2009, DOI: 10.1002/sia.3103

  17. Improved accuracy of quantitative XPS analysis using predetermined spectrometer transmission functions with UNIFIT 2004

    Surface and Interface Analysis

    Volume 37, Issue 7, July 2005, Pages: 589–607, R. Hesse, P. Streubel and R. Szargan

    Version of Record online : 17 MAY 2005, DOI: 10.1002/sia.2056

  18. You have free access to this content
    The use of Auger spectroscopy for the in situ elemental characterization of sub-micrometer presolar grains

    Meteoritics & Planetary Science

    Volume 44, Issue 7, July 2009, Pages: 1033–1049, Frank J. STADERMANN, Christine FLOSS, Maitrayee BOSE and A. Scott LEA

    Version of Record online : 26 JAN 2010, DOI: 10.1111/j.1945-5100.2009.tb00786.x

  19. Surface quantitative analysis of Cr[BOND]O systems by XPS

    Surface and Interface Analysis

    Volume 5, Issue 4, August 1983, Pages: 173–176, C. Battistoni, G. Cossu, G. Mattogno and E. Paparazzo

    Version of Record online : 15 SEP 2004, DOI: 10.1002/sia.740050410

  20. X-Ray Photoelectron Spectroscopy

    Standard Article

    Characterization of Materials

    Jeffrey J. Weimer

    Published Online : 12 OCT 2012, DOI: 10.1002/0471266965.com105.pub2