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There are 292183 results for: content related to: What's Wrong with Space Plasma Metrology?

  1. Training for the Metrology Professions in France

    Metrology in Industry: The Key for Quality

    French College of Metrology, Pages: 247–266, 2010

    Published Online : 22 JAN 2010, DOI: 10.1002/9780470612125.ch12

  2. Organization of Metrology: Industrial, Scientific, Legal

    Metrology in Industry: The Key for Quality

    Luc Erard, Jean-François Magana, Roberto Perissi, Patrick Reposeur, Jean-Michel Virieux, Pages: 43–77, 2010

    Published Online : 22 JAN 2010, DOI: 10.1002/9780470612125.ch2

  3. Reshaping European metrology research – the role of national research managers

    R&D Management

    Volume 42, Issue 2, March 2012, Pages: 170–179, Katharine E. Barker, Deborah Cox and Thordis Sveinsdottir

    Version of Record online : 22 FEB 2012, DOI: 10.1111/j.1467-9310.2011.00671.x

  4. Metrology and Quality Criteria in Software Measurement

    Software Metrics and Software Metrology

    Alain Abran, Pages: 47–66, 2010

    Published Online : 28 SEP 2010, DOI: 10.1002/9780470606834.ch3

  5. Imaging Space Plasma With Energetic Neutral Atoms Without Ionization

    Measurement Techniques in Space Plasmas Fields

    K. C. Hsieh, C. C. Curtis, Pages: 235–249, 2013

    Published Online : 20 MAR 2013, DOI: 10.1002/9781118664391.ch30

  6. Analysis of the Metrological Requirements Needed to Ensure Quality

    Metrology in Industry: The Key for Quality

    Jean-Yves Arriat, Klaus-Dieter Schitthelm, Pages: 19–42, 2010

    Published Online : 22 JAN 2010, DOI: 10.1002/9780470612125.ch1

  7. Different Ways to Overcome the Resolution Problem in Optical Micro and Nano Metrology

    Optical Imaging and Metrology: Advanced Technologies

    Wolfgang Osten, Nadya Reingand, Pages: 327–368, 2012

    Published Online : 23 AUG 2012, DOI: 10.1002/9783527648443.ch15

  8. On the Difference between 3D Imaging and 3D Metrology for Computed Tomography

    Optical Imaging and Metrology: Advanced Technologies

    Daniel Weiß, Michael Totzeck, Pages: 225–238, 2012

    Published Online : 23 AUG 2012, DOI: 10.1002/9783527648443.ch10

  9. Mastering Measurement Processes Approach to the Setting up of a Metrology Function

    Metrology in Industry: The Key for Quality

    Marc Priel, Patrick Reposeur, Pages: 79–107, 2010

    Published Online : 22 JAN 2010, DOI: 10.1002/9780470612125.ch3

  10. Scanning Probe Microscopy for Critical Measurements in the Semiconductor Industry

    Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization

    Dalia G. Yablon, Pages: 190–209, 2013

    Published Online : 8 NOV 2013, DOI: 10.1002/9781118723111.ch8

  11. Space Plasma Particle Instrumentation and the New Paradigm: Faster, Cheaper, Better

    Measurement Techniques in Space Plasmas:Particles

    Robert F. Pfaff, Joseph.E Borovsky, David T. Young, Pages: 1–16, 2013

    Published Online : 18 MAR 2013, DOI: 10.1029/GM102p0001

  12. Fundamentals of Error Analysis and their Uncertainties in Dimensional Metrology Applied to Science and Technology

    Applied Metrology for Manufacturing Engineering

    Ammar Grous, Pages: 1–84, 2013

    Published Online : 7 MAR 2013, DOI: 10.1002/9781118622551.ch1

  13. Model-Based Optical Metrology

    Optical Imaging and Metrology: Advanced Technologies

    Wolfgang Osten, Nadya Reingand, Pages: 283–304, 2012

    Published Online : 23 AUG 2012, DOI: 10.1002/9783527648443.ch13

  14. Metrology Needs for 2.5D/3D Interconnects

    Handbook of 3D Integration: 3D Process Technology

    Victor H. Vartanian, Richard A. Allen, Larry Smith, Klaus Hummler, Steve Olson, Brian Sapp, Pages: 393–430, 2014

    Published Online : 20 JUN 2014, DOI: 10.1002/9783527670109.ch29

  15. Metrology, Inspection, and Process Control in Micro-Scales

    Micro-Manufacturing: Design and Manufacturing of Micro-Products

    Omkar G. Karhade, Thomas R. Kurfess, Pages: 71–95, 2011

    Published Online : 14 MAR 2011, DOI: 10.1002/9781118010570.ch4

  16. Fast and Accurate Inflight Calculations of Electron Space Plasma Parameters

    Measurement Techniques in Space Plasmas:Particles

    P. J. Carter, R. A. Gowen, B. K. Hancock, C. Alsop, A. N. Fazakerley, Pages: 275–280, 2013

    Published Online : 18 MAR 2013, DOI: 10.1029/GM102p0275

  17. Introduction to special section on Origins and Properties of Kappa Distributions: Statistical Background and Properties of Kappa Distributions in Space Plasmas

    Journal of Geophysical Research: Space Physics

    Volume 120, Issue 3, March 2015, Pages: 1607–1619, George Livadiotis

    Version of Record online : 16 MAR 2015, DOI: 10.1002/2014JA020825

  18. Optical Metrology of Diffuse Surfaces

    Optical Shop Testing, Third Edition

    K. Creath, J. Schmit, J. C. Wyant, Pages: 756–807, 2006

    Published Online : 2 NOV 2006, DOI: 10.1002/9780470135976.ch16

  19. Surface Control

    Applied Metrology for Manufacturing Engineering

    Ammar Grous, Pages: 237–308, 2013

    Published Online : 7 MAR 2013, DOI: 10.1002/9781118622551.ch4

  20. Transmission-Error Decomposition and Fourier Series Representation

    Performance-Based Gear Metrology: Kinematic-Transmission-Error Computation and Diagnosis

    William D. Mark, Pages: 165–240, 2012

    Published Online : 8 OCT 2012, DOI: 10.1002/9781118357903.ch7