Search Results

There are 25169 results for: content related to: An introduction to three-dimensional X-ray diffraction microscopy

  1. A fast methodology to determine the characteristics of thousands of grains using three-dimensional X-ray diffraction. II. Volume, centre-of-mass position, crystallographic orientation and strain state of grains

    Journal of Applied Crystallography

    Volume 45, Issue 4, August 2012, Pages: 705–718, Hemant Sharma, Richard M. Huizenga and S. Erik Offerman

    DOI: 10.1107/S0021889812025599

  2. Polycrystal orientation mapping using scanning three-dimensional X-ray diffraction microscopy

    Journal of Applied Crystallography

    Volume 48, Issue 4, August 2015, Pages: 1094–1101, Yujiro Hayashi, Yoshiharu Hirose and Yoshiki Seno

    DOI: 10.1107/S1600576715009899

  3. Three-dimensional plastic response in polycrystalline copper via near-field high-energy X-ray diffraction microscopy

    Journal of Applied Crystallography

    Volume 45, Issue 6, December 2012, Pages: 1098–1108, S. F. Li, J. Lind, C. M. Hefferan, R. Pokharel, U. Lienert, A. D. Rollett and R. M. Suter

    DOI: 10.1107/S0021889812039519

  4. A fast methodology to determine the characteristics of thousands of grains using three-dimensional X-ray diffraction. I. Overlapping diffraction peaks and parameters of the experimental setup

    Journal of Applied Crystallography

    Volume 45, Issue 4, August 2012, Pages: 693–704, Hemant Sharma, Richard M. Huizenga and S. Erik Offerman

    DOI: 10.1107/S0021889812025563

  5. GrainSpotter: a fast and robust polycrystalline indexing algorithm

    Journal of Applied Crystallography

    Volume 47, Issue 1, February 2014, Pages: 276–284, Søren Schmidt

    DOI: 10.1107/S1600576713030185

  6. Comparison between a near-field and a far-field indexing approach for characterization of a polycrystalline sample volume containing more than 1500 grains

    Journal of Applied Crystallography

    Volume 47, Issue 4, August 2014, Pages: 1402–1416, Laura Nervo, Andrew King, Jonathan P. Wright, Wolfgang Ludwig, Péter Reischig, Joao Quinta da Fonseca and Michael Preuss

    DOI: 10.1107/S160057671401406X

  7. A method for intragranular orientation and lattice strain distribution determination

    Journal of Applied Crystallography

    Volume 45, Issue 6, December 2012, Pages: 1145–1155, Nathan R. Barton and Joel V. Bernier

    DOI: 10.1107/S0021889812040782

  8. Propagator Methods

    Advances in Chemical Physics: Ab Initio Methods in Quantum Chemistry Part 2, Volume 69

    K. P. Lawley, Pages: 201–239, 2007

    Published Online : 14 MAR 2007, DOI: 10.1002/9780470142943.ch3

  9. Quantitative grain-scale ferroic domain volume fractions and domain switching strains from three-dimensional X-ray diffraction data

    Journal of Applied Crystallography

    Volume 48, Issue 3, June 2015, Pages: 882–889, Jette Oddershede, Marta Majkut, Qinghua Cao, Søren Schmidt, Jonathan P. Wright, Peter Kenesei and John E. Daniels

    DOI: 10.1107/S1600576715007669

  10. Correlated polarization propagator calculations of static polarizabilities

    International Journal of Quantum Chemistry

    Volume 50, Issue 5, 15 May 1994, Pages: 317–332, Stephan P. A. Sauer and Jens Oddershede

    Version of Record online : 21 SEP 2004, DOI: 10.1002/qua.560500502

  11. Polarization propagator calculation of spectroscopic properties of molecules

    International Journal of Quantum Chemistry

    Volume 39, Issue 3, March 1991, Pages: 371–386, Jens Oddershede and John R. Sabin

    Version of Record online : 19 OCT 2004, DOI: 10.1002/qua.560390314

  12. On the calibration of high-energy X-ray diffraction setups. II. Assessing the rotation axis and residual strains

    Journal of Applied Crystallography

    Volume 47, Issue 5, October 2014, Pages: 1585–1595, Andras Borbély, Loïc Renversade and Peter Kenesei

    DOI: 10.1107/S1600576714014290

  13. 4D Characterization of Metal Microstructures

    Microstructural Design of Advanced Engineering Materials

    Dmitri A. Molodov, Pages: 367–385, 2013

    Published Online : 31 JUL 2013, DOI: 10.1002/9783527652815.ch15

  14. Advances in X-ray diffraction contrast tomography: flexibility in the setup geometry and application to multiphase materials

    Journal of Applied Crystallography

    Volume 46, Issue 2, April 2013, Pages: 297–311, Péter Reischig, Andrew King, Laura Nervo, Nicola Viganó, Yoann Guilhem, Willem Jan Palenstijn, K. Joost Batenburg, Michael Preuss and Wolfgang Ludwig

    DOI: 10.1107/S0021889813002604

  15. Adaptive reconstruction method for three-dimensional orientation imaging

    Journal of Applied Crystallography

    Volume 46, Issue 2, April 2013, Pages: 512–524, S. F. Li and R. M. Suter

    DOI: 10.1107/S0021889813005268

  16. Second-order polarization propagator calculations of dynamic dipole polarizabilities and C6 coefficients

    International Journal of Quantum Chemistry

    Volume 39, Issue 5, May 1991, Pages: 667–679, Stephan P. A. Sauer, Geerd H. F. Diercksen and Jens Oddershede

    Version of Record online : 19 OCT 2004, DOI: 10.1002/qua.560390504

  17. Diffraction/scattering computed tomography for three-dimensional characterization of multi-phase crystalline and amorphous materials

    Journal of Applied Crystallography

    Volume 45, Issue 6, December 2012, Pages: 1109–1124, M. Álvarez-Murga, P. Bleuet and J.-L. Hodeau

    DOI: 10.1107/S0021889812041039

  18. The Rotational g Factor of Diatomic Molecules in State 1Σ+ or 0+

    Advances in Chemical Physics, Volume 111

    J. F. Ogilvie, J. Oddershede, Stephan P. A. Sauer, Pages: 475–536, 2007

    Published Online : 14 MAR 2007, DOI: 10.1002/9780470141700.ch4

  19. Calculation of spectra and spin–spin coupling constants using a coupled–cluster polarization propagator method

    International Journal of Quantum Chemistry

    Volume 32, Issue S21, 12 March 1987, Pages: 475–485, Jan Geertsen, Jens Oddershede and Gustavo E. Scuseria

    Version of Record online : 19 OCT 2004, DOI: 10.1002/qua.560320746

  20. A calculation of the isotropic and anisotropic spectral moments of the dipole oscillator strength distribution of N2

    International Journal of Quantum Chemistry

    Volume 39, Issue 6, June 1991, Pages: 755–766, G. H. F. Diercksen, J. Oddershede, I. Paidarova and J. R. Sabin

    Version of Record online : 19 OCT 2004, DOI: 10.1002/qua.560390602