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There are 22055 results for: content related to: Directional pair distribution function for diffraction line profile analysis of atomistic models

  1. Ab initio test of the Warren–Averbach analysis on model palladium nanocrystals

    Journal of Applied Crystallography

    Volume 38, Issue 2, April 2005, Pages: 266–273, Zbigniew Kaszkur, Bogusław Mierzwa and Jerzy Pielaszek

    DOI: 10.1107/S0021889804033291

  2. A method for the interpretation of the Warren–Averbach mean-squared strains and its application to recovery in aluminium

    Journal of Applied Crystallography

    Volume 16, Issue 2, April 1983, Pages: 176–182, M. J. Turunen, Th. De Keijser, R. Delhez and N. M. van. der. Pers

    DOI: 10.1107/S0021889883010225

  3. MarqX: a new program for whole-powder-pattern fitting

    Journal of Applied Crystallography

    Volume 33, Issue 1, February 2000, Pages: 184–189, Y. H. Dong and P. Scardi

    DOI: 10.1107/S002188989901434X

  4. Size–strain line-broadening analysis of the ceria round-robin sample

    Journal of Applied Crystallography

    Volume 37, Issue 6, December 2004, Pages: 911–924, D. Balzar, N. Audebrand, M. R. Daymond, A. Fitch, A. Hewat, J. I. Langford, A. Le Bail, D. Louër, O. Masson, C. N. McCowan, N. C. Popa, P. W. Stephens and B. H. Toby

    DOI: 10.1107/S0021889804022551

  5. Effect of symmetrical background error in the Warren–Averbach analysis

    Journal of Applied Crystallography

    Volume 3, Issue 4, August 1970, Pages: 205–211, G. Gilli and P. A. Borea

    DOI: 10.1107/S0021889870006052

  6. Diffraction-Line Broadening due to Strain Fields in Materials; Fundamental Aspects and Methods of Analysis

    Acta Crystallographica Section A

    Volume 52, Issue 5, September 1996, Pages: 730–747, J. G. M. Van Berkum, R. Delhez, Th. H. De Keijser and E. J. Mittemeijer

    DOI: 10.1107/S0108767396005727

  7. Applicabilities of the Warren–Averbach analysis and an alternative analysis for separation of size and strain broadening

    Journal of Applied Crystallography

    Volume 27, Issue 3, June 1994, Pages: 345–357, J. G. M. Van Berkum, A. C. Vermeulen, R. Delhez, T. H. De Keijser and E. J. Mittemeijer

    DOI: 10.1107/S0021889893010568

  8. Remarks on separation of particle size and strain by line profile analysis using Fourier coefficients

    Journal of Applied Crystallography

    Volume 7, Issue 3, June 1974, Pages: 350–355, G. B. Mitra and A. K. Chaudhuri

    DOI: 10.1107/S0021889874009794

  9. Voigt-function modeling in Fourier analysis of size- and strain-broadened X-ray diffraction peaks

    Journal of Applied Crystallography

    Volume 26, Issue 1, February 1993, Pages: 97–103, D. Balzar and H. Ledbetter

    DOI: 10.1107/S0021889892008987

  10. Simultaneous structure and size–strain refinement by the Rietveld method

    Journal of Applied Crystallography

    Volume 23, Issue 4, August 1990, Pages: 246–252, L. Lutterotti and P. Scardi

    DOI: 10.1107/S0021889890002382

  11. Profile fitting of X-ray diffraction lines and Fourier analysis of broadening

    Journal of Applied Crystallography

    Volume 25, Issue 5, October 1992, Pages: 559–570, D. Balzar

    DOI: 10.1107/S0021889892004084

  12. Line profile analysis: pattern modelling versus profile fitting

    Journal of Applied Crystallography

    Volume 39, Issue 1, February 2006, Pages: 24–31, Matteo Leoni and Paolo Scardi

    DOI: 10.1107/S0021889805032978

  13. Line broadening analysis using integral breadth methods: a critical review

    Journal of Applied Crystallography

    Volume 37, Issue 3, June 2004, Pages: 381–390, P. Scardi, M. Leoni and R. Delhez

    DOI: 10.1107/S0021889804004583

  14. An evaluation of methods of diffraction-line broadening analysis applied to ball-milled molybdenum

    Journal of Applied Crystallography

    Volume 37, Issue 2, April 2004, Pages: 300–311, I. Lucks, P. Lamparter and E. J. Mittemeijer

    DOI: 10.1107/S0021889804003140

  15. Crystallite size distribution and dislocation structure determined by diffraction profile analysis: principles and practical application to cubic and hexagonal crystals

    Journal of Applied Crystallography

    Volume 34, Issue 3, June 2001, Pages: 298–310, T. Ungár, J. Gubicza, G. Ribárik and A. Borbély

    DOI: 10.1107/S0021889801003715

  16. On the interpretation of the determination of particle size and distortion of crystallites with a screw dislocation

    Kristall und Technik

    Volume 14, Issue 5, 1979, Pages: 589–601, Dr. H. Röll

    Version of Record online : 27 MAR 2006, DOI: 10.1002/crat.19790140513

  17. XBroad: program for extracting basic microstructure information from X-ray diffraction patterns in few clicks

    Journal of Applied Crystallography

    Volume 45, Issue 3, June 2012, Pages: 594–597, Zeljko Skoko, Jasminka Popovic, Kresimir Dekanic, Vladimir Kolbas and Stanko Popovic

    DOI: 10.1107/S0021889812014859

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    When Erving Goffman Was a Boy: The Formative Years of a Sociological Giant

    Symbolic Interaction

    Volume 37, Issue 1, February 2014, Pages: 41–70, Sherri Cavan

    Version of Record online : 6 NOV 2013, DOI: 10.1002/symb.83

  19. Effect of non-linearity error in the Warren–Averbach analysis

    Journal of Applied Crystallography

    Volume 6, Issue 3, June 1973, Pages: 203–205, G. Gilli and P. A. Borea

    DOI: 10.1107/S0021889873008484

  20. The elimination of an approximation in the Warren–Averbach analysis

    Journal of Applied Crystallography

    Volume 9, Issue 3, June 1976, Pages: 233–234, R. Delhez and E. J. Mittemeijer

    DOI: 10.1107/S0021889876011035