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There are 3657 results for: content related to: Analysis of recrystallized volume fractions in uranium using electron backscatter diffraction

  1. You have free access to this content
    Quantitative metallography by electron backscattered diffraction

    Journal of Microscopy

    Volume 195, Issue 3, September 1999, Pages: 170–185, F. J. HUMPHREYS

    Version of Record online : 11 DEC 2003, DOI: 10.1046/j.1365-2818.1999.00578.x

  2. Making EBSD on water ice routine

    Journal of Microscopy

    Volume 259, Issue 3, September 2015, Pages: 237–256, D.J. PRIOR, K. LILLY, M. SEIDEMANN, M. VAUGHAN, L. BECROFT, R. EASINGWOOD, S. DIEBOLD, R. OBBARD, C. DAGHLIAN, I. BAKER, T. CASWELL, N. GOLDING, D. GOLDSBY, W.B. DURHAM, S. PIAZOLO and C.J.L. WILSON

    Version of Record online : 28 APR 2015, DOI: 10.1111/jmi.12258

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    Cryogenic EBSD on ice: preserving a stable surface in a low pressure SEM

    Journal of Microscopy

    Volume 242, Issue 3, June 2011, Pages: 295–310, I. WEIKUSAT, D. A. M. DE WINTER, G. M. PENNOCK, M. HAYLES, C. T. W. M. SCHNEIJDENBERG and M. R. DRURY

    Version of Record online : 13 DEC 2010, DOI: 10.1111/j.1365-2818.2010.03471.x

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    Electron backscatter diffraction beyond the mainstream

    Crystal Research and Technology

    Volume 52, Issue 1, January 2017, Gert Nolze, Ralf Hielscher and Aimo Winkelmann

    Version of Record online : 24 OCT 2016, DOI: 10.1002/crat.201600252

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    Ion beam polishing for three-dimensional electron backscattered diffraction

    Journal of Microscopy

    Volume 249, Issue 1, January 2013, Pages: 36–40, N. SAOWADEE, K. AGERSTED, H.S. UBHI and J.R. BOWEN

    Version of Record online : 5 NOV 2012, DOI: 10.1111/j.1365-2818.2012.03677.x

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    Improving the quality of electron backscatter diffraction (EBSD) patterns from nanoparticles

    Journal of Microscopy

    Volume 206, Issue 2, May 2002, Pages: 170–178, J. A. Small, J. R. Michael and D. S. Bright

    Version of Record online : 7 MAY 2002, DOI: 10.1046/j.1365-2818.2002.01015.x

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    Transmission EBSD from 10 nm domains in a scanning electron microscope

    Journal of Microscopy

    Volume 245, Issue 3, March 2012, Pages: 245–251, R.R. KELLER and R.H. GEISS

    Version of Record online : 17 NOV 2011, DOI: 10.1111/j.1365-2818.2011.03566.x

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    Resolution of impact-related microstructures in lunar zircon: A shock-deformation mechanism map

    Meteoritics & Planetary Science

    Volume 47, Issue 1, January 2012, Pages: 120–141, Nicholas E. TIMMS, Steven M. REDDY, David HEALY, Alexander A. NEMCHIN, Marion L. GRANGE, Robert T. PIDGEON and Robert HART

    Version of Record online : 16 DEC 2011, DOI: 10.1111/j.1945-5100.2011.01316.x

  9. Analysis of traction-free assumption in high-resolution EBSD measurements

    Journal of Microscopy

    Volume 260, Issue 1, October 2015, Pages: 73–85, T.J. HARDIN, T.J. RUGGLES, D.P. KOCH, S.R. NIEZGODA, D.T. FULLWOOD and E.R. HOMER

    Version of Record online : 2 JUL 2015, DOI: 10.1111/jmi.12268

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    Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy

    Journal of Microscopy

    Volume 213, Issue 3, March 2004, Pages: 214–224, D. Dingley

    Version of Record online : 19 FEB 2004, DOI: 10.1111/j.0022-2720.2004.01321.x

  11. Comparison of quartz crystallographic preferred orientations identified with optical fabric analysis, electron backscatter and neutron diffraction techniques

    Journal of Microscopy

    Volume 265, Issue 2, February 2017, Pages: 169–184, N.J.R. HUNTER, C.J.L. WILSON and V. LUZIN

    Version of Record online : 22 SEP 2016, DOI: 10.1111/jmi.12472

  12. Comparison of EBSD patterns simulated by two multislice methods

    Journal of Microscopy

    Volume 264, Issue 1, October 2016, Pages: 71–78, Q.B. LIU, C.Y. CAI, G.W. ZHOU and Y.G. WANG

    Version of Record online : 9 MAY 2016, DOI: 10.1111/jmi.12418

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    The complementary use of electron backscatter diffraction and ion channelling imaging for the characterization of nanotwins

    Journal of Microscopy

    Volume 249, Issue 2, February 2013, Pages: 111–118, H. ALIMADADI, A.B. FANTA and K. PANTLEON

    Version of Record online : 18 DEC 2012, DOI: 10.1111/j.1365-2818.2012.03690.x

  14. An experimental viewpoint on the information depth of EBSD

    Scanning

    Volume 38, Issue 2, March/April 2016, Pages: 164–171, Wolfgang Wisniewski and Christian Rüssel

    Version of Record online : 6 AUG 2015, DOI: 10.1002/sca.21251

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    A novel method for acquiring large-scale automated scanning electron microscope data

    Journal of Microscopy

    Volume 244, Issue 2, November 2011, Pages: 181–186, A.R. SHIVELEY, P.A. SHADE, A.L. PILCHAK, J.S. TILEY and R. KERNS

    Version of Record online : 2 AUG 2011, DOI: 10.1111/j.1365-2818.2011.03524.x

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    Application of electron backscatter diffraction to the study of phase transformations: present and possible future

    Journal of Microscopy

    Volume 233, Issue 3, March 2009, Pages: 460–473, A.-F. GOURGUES-LORENZON

    Version of Record online : 27 FEB 2009, DOI: 10.1111/j.1365-2818.2009.03130.x

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    Site-specific structural investigations of oxidized nickel samples modified by plasma erosion processes

    Journal of Microscopy

    Volume 227, Issue 1, July 2007, Pages: 42–50, C. HOLZAPFEL, F. SOLDERA, E. A. FAUNDEZ and F. MÜCKLICH

    Version of Record online : 14 JUL 2007, DOI: 10.1111/j.1365-2818.2007.01781.x

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    Principles of depth-resolved Kikuchi pattern simulation for electron backscatter diffraction

    Journal of Microscopy

    Volume 239, Issue 1, July 2010, Pages: 32–45, A. WINKELMANN

    Version of Record online : 3 DEC 2009, DOI: 10.1111/j.1365-2818.2009.03353.x

  19. You have free access to this content
    Phase identification of individual crystalline particles by electron backscatter diffraction

    Journal of Microscopy

    Volume 201, Issue 1, January 2001, Pages: 59–69, J. A. Small and J. R. Michael

    Version of Record online : 21 DEC 2001, DOI: 10.1046/j.1365-2818.2001.00788.x

  20. You have free access to this content
    Accuracy assessment of elastic strain measurement by EBSD

    Journal of Microscopy

    Volume 233, Issue 2, February 2009, Pages: 290–301, S. VILLERT, C. MAURICE, C. WYON and R. FORTUNIER

    Version of Record online : 28 JAN 2009, DOI: 10.1111/j.1365-2818.2009.03120.x