The Multiple Logistic Regression ModelApplied Logistic Regression, Third Edition
David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant, Pages: 35–47, 2013
Published Online : 28 AUG 2013, DOI: 10.1002/9781118548387.ch2
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FrontMatterApplied Logistic Regression, Third Edition
David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant, Pages: i–xvi, 2013
Published Online : 28 AUG 2013, DOI: 10.1002/9781118548387.fmatter
Special TopicsApplied Logistic Regression, Third Edition
David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant, Pages: 377–457, 2013
Published Online : 28 AUG 2013, DOI: 10.1002/9781118548387.ch10
Multiple Logistic RegressionApplied Logistic Regression, Second Edition
David W. Hosmer, Stanley Lemeshow, Pages: 31–46, 2005
Published Online : 28 JAN 2005, DOI: 10.1002/0471722146.ch2
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ReferencesApplied Logistic Regression, Second Edition
David W. Hosmer, Stanley Lemeshow, Pages: 354–367, 2005
Published Online : 28 JAN 2005, DOI: 10.1002/0471722146.refs
Introduction to the Logistic Regression ModelApplied Logistic Regression, Third Edition
David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant, Pages: 1–33, 2013
Published Online : 28 AUG 2013, DOI: 10.1002/9781118548387.ch1
Assessing the Fit of the ModelApplied Logistic Regression, Third Edition
David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant, Pages: 153–225, 2013
Published Online : 28 AUG 2013, DOI: 10.1002/9781118548387.ch5
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IndexApplied Logistic Regression, Second Edition
David W. Hosmer, Stanley Lemeshow, Pages: 369–375, 2005
Published Online : 28 JAN 2005, DOI: 10.1002/0471722146.index
Assessing the Fit of the ModelApplied Logistic Regression, Second Edition
David W. Hosmer, Stanley Lemeshow, Pages: 143–202, 2005
Published Online : 28 JAN 2005, DOI: 10.1002/0471722146.ch5
You have free access to this content
IndexApplied Logistic Regression, Third Edition
David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant, Pages: 479–500, 2013
Published Online : 28 AUG 2013, DOI: 10.1002/9781118548387.index
You have free access to this content
You have free access to this content
You have free access to this content
Wiley Series in Probability and StatisticsApplied Logistic Regression, Third Edition
David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant, Pages: 501–510, 2013
Published Online : 28 AUG 2013, DOI: 10.1002/9781118548387.scard