Materials Characterization: Introduction to Microscopic and Spectroscopic Methods
Copyright © 2008 John Wiley & Sons (Asia) Pte Ltd
Author(s): Yang Leng
Published Online: 29 JAN 2010 12:00AM EST
Print ISBN: 9780470822982
Online ISBN: 9780470823002
About this Book
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.