Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

Author(s): Yang Leng

Published Online: 29 JAN 2010 12:00AM EST

Print ISBN: 9780470822982

Online ISBN: 9780470823002

DOI: 10.1002/9780470823002

About this Book

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

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