Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
Copyright © 2012 John Wiley & Sons, Inc.
Author(s): Greg Haugstad
Published Online: 24 AUG 2012 11:42AM EST
Print ISBN: 9780470638828
Online ISBN: 9781118360668
About this Book
About The Product
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.
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