Low Voltage Electron Microscopy: Principles and Applications

Low Voltage Electron Microscopy: Principles and Applications

Editor(s): David C. Bell, Natasha Erdman

Published Online: 18 DEC 2012 08:55PM EST

Print ISBN: 9781119971115

Online ISBN: 9781118498514

DOI: 10.1002/9781118498514

Series Editor(s): Susan Brooks

About this Book

Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing.

It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before.

Table of contents

    1. You have free access to this content
    2. Chapter 3

      Extreme High-Resolution (XHR) SEM Using a Beam Monochromator (pages 57–71)

      Richard J. Young, Gerard N. A. van Veen, Alexander Henstra and Lubomir Tuma

    3. Chapter 6

      Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits (pages 119–161)

      Ondrej L. Krivanek, Wu Zhou, Matthew F. Chisholm, Juan Carlos Idrobo, Tracy C. Lovejoy, Quentin M. Ramasse and Niklas Dellby

    4. You have free access to this content
    5. You have free access to this content

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