Applied Logistic Regression, Third Edition
Copyright © 2013 John Wiley & Sons, Inc.
Author(s): David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant
Print ISBN: 9780470582473
Online ISBN: 9781118548387
DOI: 10.1002/9781118548387
Book Series: Wiley Series in Probability and Statistics
Author Biography
About the Author
DAVID W. HOSMER, Jr., PhD, is Professor Emeritus of Biostatistics at the School of Public Health and Health Sciences at the University of Massachusetts Amherst.
STANLEY LEMESHOW, PhD, is Professor of Biostatistics and Founding Dean of the College of Public Health at The Ohio State University, Columbus, Ohio.
RODNEY X. STURDIVANT, PhD, is Associate Professor and Founding Director of the Center for Data Analysis and Statistics at the United States Military Academy at West Point, New York.
