Applied Logistic Regression, Third Edition
Copyright © 2013 John Wiley & Sons, Inc.
Author(s): David W. Hosmer, Jr., Stanley Lemeshow, Rodney X. Sturdivant
Print ISBN: 9780470582473
Online ISBN: 9781118548387
DOI: 10.1002/9781118548387
Book Series: Wiley Series in Probability and Statistics
Reviews
"In conclusion, the index was mercifully complete, and all items searched for were found (nice cross-referencing too) In summary: Highly recommended." (Scientific Computing, 1 May 2013)
