Combined Analysis

Combined Analysis

Author(s): Daniel Chateigner

Published Online: 7 MAR 2013 08:12PM EST

Print ISBN: 9781848211988

Online ISBN: 9781118622506

DOI: 10.1002/9781118622506

About this Book

This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models.

Table of contents

    1. You have free access to this content
    2. You have free access to this content
    3. You have free access to this content
    4. You have free access to this content
    5. You have free access to this content
    6. You have free access to this content

SEARCH