Aberration-Corrected Analytical Transmission Electron Microscopy
Copyright © 2011 John Wiley & Sons, Ltd
Editor(s): Rik Brydson
Published Online: 26 JUL 2011 10:31PM EST
Print ISBN: 9780470518519
Online ISBN: 9781119978848
DOI: 10.1002/9781119978848
Series Editor(s): Susan Brooks
Reviews
"This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)." (Imaging & Microscopy, 1 March 2012)