Modern Drying Technology: Experimental Techniques, Volume 2

Modern Drying Technology: Experimental Techniques, Volume 2

Editor(s): Evangelos Tsotsas, Arun S. Mujumdar

Published Online: 20 JAN 2011 01:23PM EST

Print ISBN: 9783527315574

Online ISBN: 9783527631643

DOI: 10.1002/9783527631643

About this Book

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About The Product

Volume two of a five-volume handbook that provides a comprehensive overview of all important aspects of modern drying technology, presenting high-level, cutting-edge results.

Volume 2 comprises modern experimental techniques such as magnetic resonance imaging for measurement and visualisation of moisture profiles in the interior of porous bodies during drying, Raman spectroscopy for measurement of concentration profiles during the drying of thin films/coatings and analytical methods for measurement of drying kinetics. Other modern experimental techniques covered include sorption equilibria and moisture content of individual particles, techniques for the determination of important quality indices - functional and structural properties - of dried products and instrumentation of modern drying equipment and respective plants.

Table of contents

    1. You have free access to this content
    2. Chapter 1

      Measurement of Average Moisture Content and Drying Kinetics for Single Particles, Droplets and Dryers (pages 1–71)

      Jun.-Prof. Mirko Peglow, Jun.-Prof. Thomas Metzger, Prof. Geoffrey Lee, Dr. Heiko Schiffter, Dipl.-Ing. Robert Hampel, Prof. Stefan Heinrich and Prof. Evangelos Tsotsas

    3. Chapter 5

      Measuring Techniques for Particle Formulation Processes (pages 187–278)

      Prof. Stefan Heinrich, Dr. Niels G. Deen, Jun.-Prof. Mirko Peglow, Prof. Mike Adams, Prof. Johannes A. M. Kuipers, Prof. Evangelos Tsotsas and Jonathan P. K. Seville

    4. Chapter 6

      Determination of Physical Properties of Fine Particles, Nanoparticles and Particle Beds (pages 279–362)

      Dr. Werner Hintz, Dr. Sergiy Antonyuk, Dr. Wolfgang Schubert, Dipl.-Ing. Bernd Ebenau, Dipl.-Ing. Aimo Haack and Prof. Jürgen Tomas

    5. You have free access to this content

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