Optical Imaging and Metrology: Advanced Technologies
Copyright © 2012 Wiley-VCH Verlag & Co. KGaA
Editor(s): Wolfgang Osten, Nadya Reingand
Published Online: 23 AUG 2012 06:16AM EST
Print ISBN: 9783527410644
Online ISBN: 9783527648443
DOI: 10.1002/9783527648443
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A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.