Optical Imaging and Metrology: Advanced Technologies

Optical Imaging and Metrology: Advanced Technologies

Editor(s): Wolfgang Osten, Nadya Reingand

Published Online: 23 AUG 2012 06:16AM EST

Print ISBN: 9783527410644

Online ISBN: 9783527648443

DOI: 10.1002/9783527648443

About this Book

A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.

Table of contents

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      Chapter 1

      LCOS Spatial Light Modulators: Trends and Applications (pages 1–29)

      Grigory Lazarev, Andreas Hermerschmidt, Sven Krüger and Stefan Osten

  1. Part I: Nanomaterials: Laser Based Processing Techniques

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