Optical Imaging and Metrology: Advanced Technologies

Optical Imaging and Metrology: Advanced Technologies

Editor(s): Wolfgang Osten, Nadya Reingand

Print ISBN: 9783527410644

Online ISBN: 9783527648443

DOI: 10.1002/9783527648443

Author Biography

About the Author

Wolfgang Osten received his Ph.D. from the Martin-Luther-University Halle-Wittenberg, Germany, for his thesis in the field of holographic interferometry in 1983. From 1984 to 1991, he was a member of the Central Institute of Cybernetics and Information Processes in Berlin where he headed the Institute for Image Processing from 1988 to 1991. In 1991, he joined the Bremen Institute of Applied Beam Technology (BIAS) to establish and direct the Department of Optical 3D-Metrology. Since 2002 he has been a full professor at the University of Stuttgart and director of the Institute for Applied Optics. Professor Osten's research is focused on new concepts for industrial inspection and metrology by combining modern principles of optical metrology, sensor technology and image processing. Special attention is paid to the development of resolution enhanced technologies for the investigation of micro and nano structures.

Nadya Reingand holds a Ph.D. in holography and is licensed to practice Patent Law before the US Patent Office. She teaches courses on intellectual property with a special focus on non-profits. Extensive experience of 15 years in science gives her insight of scientists' needs when it comes to the commercialization of their university inventions. Her international experience includes working on International Cooperation in the Russian Academy of Sciences, research positions in several countries, chairing and organizing multiple international scientific conferences, and later managing patent portfolios of international companies.