Modern Diffraction Methods

Copyright © 2013 Wiley-VCH Verlag GmbH & Co. KGaA

Modern Diffraction Methods

Editor(s): Eric J. Mittemeijer, Udo Welzel

Published Online: 14 JAN 2013 01:40AM EST

Print ISBN: 9783527322794

Online ISBN: 9783527649884

DOI: 10.1002/9783527649884

About this Book

Product Information

About The Product

The first comprehensive overview of the potential and virtues of modern diffraction methods, this book covers various applications in which these versatile and very important techniques play a major role. These range from nanoscience to materials science, surface technologies to single crystal structure determination, and the analysis of phases and phase transformations to the microstructure of materials.
Of major interest to biochemists, material scientists, material engineers and also those working in industry.

Table of contents

    1. You have free access to this content
      Front Matter (pages I–XXVI)

  2. Part I: Structure Determination

    1. Chapter 1

      Structure Determination of Single Crystals (pages 1–26)

      Sander van Smaalen

    2. Chapter 2

      Modern Rietveld Refinement, a Practical Guide (pages 27–60)

      Robert Dinnebier and Melanie Müller

    3. Chapter 3

      Structure of Nanoparticles from Total Scattering (pages 61–86)

      Katharine L. Page, Thomas Proffen and Reinhard B. Neder

  3. Part II: Analysis of the Microstructure

    1. Chapter 4

      Diffraction Line-Profile Analysis (pages 87–126)

      Prof. Dr. Eric J. Mittemeijer and Dr. Udo Welzel

    2. Chapter 5

      Residual Stress Analysis by X-Ray Diffraction Methods (pages 127–154)

      Christoph Genzel, Ingwer A. Denks and Manuela Klaus

    3. Chapter 6

      Stress Analysis by Neutron Diffraction (pages 155–171)

      Lothar Pintschovius and Michael Hofmann

    4. Chapter 7

      Texture Analysis by Advanced Diffraction Methods (pages 173–220)

      Hans-Rudolf Wenk

    5. Chapter 8

      Surface-Sensitive X-Ray Diffraction Methods (pages 221–257)

      Andreas Stierle and Elias Vlieg

    6. Chapter 9

      The Micro- and Nanostructure of Imperfect Oxide Epitaxial Films (pages 259–282)

      Alexandre Boulle, Florine Conchon and René Guinebretière

  4. Part III: Phase Analysis and Phase Transformations

    1. Chapter 10

      Quantitative Phase Analysis Using the Rietveld Method (pages 283–320)

      Ian C. Madsen, Nicola V. Y. Scarlett, Daniel P. Riley and Mark D. Raven

    2. Chapter 11

      Kinetics of Phase Transformations and of Other Time-Dependent Processes in Solids Analyzed by Powder Diffraction (pages 321–358)

      Andreas Leineweber and Prof. Dr. Eric J. Mittemeijer

  5. Part IV: Diffraction Methods and Instrumentation

    1. Chapter 12

      Laboratory Instrumentation for X-Ray Powder Diffraction: Developments and Examples (pages 359–398)

      Dr. Udo Welzel and Prof. Dr. Eric J. Mittemeijer

    2. Chapter 13

      The Calibration of Laboratory X-Ray Diffraction Equipment Using NIST Standard Reference Materials (pages 399–438)

      James P. Cline, David Black, Donald Windover and Albert Henins

    3. Chapter 14

      Synchrotron Diffraction: Capabilities, Instrumentation, and Examples (pages 439–468)

      Gene E. Ice

    4. Chapter 15

      High-Energy Electron Diffraction: Capabilities, Instrumentation, and Examples (pages 469–489)

      Christoph T. Koch

    5. Chapter 16

      In Situ Diffraction Measurements: Challenges, Instrumentation, and Examples (pages 491–517)

      Helmut Ehrenberg, Anatoliy Senyshyn, Manuel Hinterstein and Hartmut Fuess

    1. You have free access to this content
      Index (pages 519–528)

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