In-Situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science

In-Situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science

Editor(s): Gerhard Dehm, James M. Howe, Josef Zweck

Published Online: 24 APR 2012 02:03AM EST

Print ISBN: 9783527319732

Online ISBN: 9783527652167

DOI: 10.1002/9783527652167

About this Book

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers
real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information
on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

Table of contents

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  1. Part I: Basics and Methods

    1. Chapter 3

      Dynamic Transmission Electron Microscopy (pages 71–97)

      Thomas Lagrange, Bryan W. Reed, Wayne E. King, Judy S. Kim and Geoffrey H. Campbell

  2. Part II: Growth and Interactions

  3. Part III: Mechanical Properties

  4. Part IV: Physical Properties

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