In-Situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science
Copyright © 2012 Wiley-VCH Verlag GmbH & Co. KGaA

Editor(s): Gerhard Dehm, James M. Howe, Josef Zweck
Published Online: 24 APR 2012 02:03AM EST
Print ISBN: 9783527319732
Online ISBN: 9783527652167
DOI: 10.1002/9783527652167
About this Book
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Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers
real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information
on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.
