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Electronics and Communications in Japan (Part II: Electronics)

Cover image for Electronics and Communications in Japan (Part II: Electronics)

February 1999

Volume 82, Issue 2

Pages 1–61

    1. Preparation and properties of a sputtered Mo/MoOx black matrix (pages 1–10)

      Yasuhiro Ugai, Kazuhisa Nishimura, Shigeo Aoki and Makoto Kawasaki

      Article first published online: 5 MAR 1999 | DOI: 10.1002/(SICI)1520-6432(199902)82:2<1::AID-ECJB1>3.0.CO;2-#

    2. An investigation of stable bonding for Au–Al solid phase diffusion bonding techniques (pages 11–20)

      Miki Mori, Yumi Fukuda, Yukio Kizaki, Atsuko Iida and Masayuki Saito

      Article first published online: 5 MAR 1999 | DOI: 10.1002/(SICI)1520-6432(199902)82:2<11::AID-ECJB2>3.0.CO;2-T

    3. Micro total analysis system (μTAS) (pages 21–29)

      Shuichi Shoji

      Article first published online: 5 MAR 1999 | DOI: 10.1002/(SICI)1520-6432(199902)82:2<21::AID-ECJB3>3.0.CO;2-N

    4. Measuring system for simulation parameters of chemical amplification resist systems (pages 30–38)

      Atsushi Sekiguchi, Mikio Kadoi, Toshiharu Matsuzawa and Youichi Minami

      Article first published online: 5 MAR 1999 | DOI: 10.1002/(SICI)1520-6432(199902)82:2<30::AID-ECJB4>3.0.CO;2-I

    5. Ferroelectric memory transient analysis on read mode (pages 39–47)

      Kiyoshi Nishimura, Takaaki Fuchikami and Kazuhiro Hoshiba

      Article first published online: 5 MAR 1999 | DOI: 10.1002/(SICI)1520-6432(199902)82:2<39::AID-ECJB5>3.0.CO;2-6

    6. Recent progress in SiC-based device processing (pages 48–54)

      Toshiyuki Ohno

      Article first published online: 5 MAR 1999 | DOI: 10.1002/(SICI)1520-6432(199902)82:2<48::AID-ECJB6>3.0.CO;2-1

    7. Growth of crystalline SiC films by triode plasma CVD using an organosilicon compound (pages 55–61)

      Kanji Yasui, Masahide Kimura and Tadashi Akahane

      Article first published online: 5 MAR 1999 | DOI: 10.1002/(SICI)1520-6432(199902)82:2<55::AID-ECJB7>3.0.CO;2-Z

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