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Chapter 17. S

  1. Dr D. E. Packham
  1. Dr B C Cope1,
  2. Dr D E Packham19,
  3. Professor Graham Leggett2,
  4. Mr J C Beech3,
  5. Dr G B Lowe4,
  6. Professor D Briggs5,
  7. Dr D M Brewis6,
  8. Dr A D Crocombe7,
  9. Dr D G Dixon8,
  10. Professor W J Van Ooij9,
  11. Dr B Parbhoo10,
  12. Dr C M Warwick11,
  13. Mr J Pritchard12,
  14. Mr S Millington13,
  15. Dr C Chatfield19,
  16. Professor J Comyn14,
  17. Professor David A Dillard15,
  18. Dr B Kneafsey16,
  19. Dr M E R Shanahan17,
  20. Dr Alphonsus V Pocius18

Published Online: 1 SEP 2005

DOI: 10.1002/0470014229.ch17

Handbook of Adhesion, Second Edition

Handbook of Adhesion, Second Edition

How to Cite

Cope, B. C., Packham, D. E., Leggett, G., Beech, J. C., Lowe, G. B., Briggs, D., Brewis, D. M., Crocombe, A. D., Dixon, D. G., Van Ooij, W. J., Parbhoo, B., Warwick, C. M., Pritchard, J., Millington, S., Chatfield, C., Comyn, J., Dillard, D. A., Kneafsey, B., Shanahan, M. E. R. and Pocius, A. V. (2005) S, in Handbook of Adhesion, Second Edition (ed D. E. Packham), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/0470014229.ch17

Editor Information

  1. University of Bath, Bath, UK

Author Information

  1. 1

    Formerly of De Montfort University, Leicestershire, UK

  2. 2

    The University of Sheffield, Sheffield, UK

  3. 3

    Building Research Establishment, Garston, UK

  4. 4

    GBL Consultants, Leicester, UK

  5. 5

    Siacon Consultants, Malvern, UK

  6. 6

    Loughborough University, Loughborough, UK

  7. 7

    University of Guildford, Surrey, UK

  8. 8

    BAE Systems, Bristol, UK

  9. 9

    University of Cincinnati, Ohio, USA

  10. 10

    Dow Corning Ltd., Glamorgan, UK

  11. 11

    TWI Ltd Cambridge, UK

  12. 12

    Birmingham, UK

  13. 13

    QinetiQ Ltd, Farnborough, UK

  14. 14

    Loughborough University, Leicestershire, UK

  15. 15

    Virginia Polytechnic, Virginia, USA

  16. 16

    Henkel-Loctite Ltd, Dublin, Ireland

  17. 17

    Centre des Matériaux, (CMGD), Evry, France

  18. 18

    3M Corporate Research Materials Laboratory, MN, USA

  19. 19

    University of Bath, Bath, UK

Publication History

  1. Published Online: 1 SEP 2005
  2. Published Print: 22 APR 2005

ISBN Information

Print ISBN: 9780471808749

Online ISBN: 9780470014226

SEARCH

Keywords:

  • scanning electron microscope (SEM);
  • backscattered primary electrons;
  • electron probe microanalysis;
  • secondary ion mass spectrometry (SIMS);
  • STM (scanning tunnelling microscopy);
  • sealant joint;
  • adhesives and adhesion standards;
  • statistical quality control;
  • step polymerization;
  • “Engineering” polymer surfaces

Summary

This chapter contains sections titled:

  • Scanning electron microscopy

  • Scanning probe microscopy

  • Scratch test

  • Sealant joint design

  • Sealants

  • Sealants in double glazing

  • Secondary ion mass spectrometry (SIMS)

  • Selection of adhesives

  • Selection of joint sealants

  • Shear tests

  • Silane adhesion promotors

  • Silanes as metal pre-treatments

  • Silicone adhesion

  • Silicone adhesives: addition cure

  • Silicone adhesives: condensation cure

  • Silicone properties

  • Silicone structures

  • Solvent welding

  • Solvent-based adhesives

  • Standards for adhesives and adhesion

  • Statistics

  • Step polymerization

  • Stress distribution: beam on elastic foundation

  • Stress distribution: bond thickness

  • Stress distribution: mode of failure

  • Stress distribution: Poisson's ratio

  • Stress distribution: shear lag solution

  • Stress distribution: stress singularities

  • Structural adhesives

  • Surface analysis

  • Surface characterization by contact angles – metals

  • Surface characterization by contact angles – polymers

  • Surface energy

  • Surface energy components

  • Surface forces apparatus

  • Surface nature of polymers