Chapter 1. Introduction

  1. Kouichi Tsuji1,
  2. Jasna Injuk2 and
  3. René Van Grieken3
  1. René Van Grieken

Published Online: 9 JUN 2004

DOI: 10.1002/0470020431.ch1

X-Ray Spectrometry: Recent Technological Advances

X-Ray Spectrometry: Recent Technological Advances

How to Cite

Van Grieken, R. (2004) Introduction, in X-Ray Spectrometry: Recent Technological Advances (eds K. Tsuji, J. Injuk and R. Van Grieken), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/0470020431.ch1

Editor Information

  1. 1

    Department of Applied Chemistry, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan

  2. 2

    Micro and Trace Analysis Center, University of Antwerp, Belgium

  3. 3

    Department of Chemistry, Micro and Trace Analysis Center, University of Antwerp, Universiteitsplein I, B-2610 Antwerp, Belgium

Author Information

  1. Department of Chemistry, Micro and Trace Analysis Center, University of Antwerp, Universiteitsplein I, B-2610 Antwerp, Belgium

Publication History

  1. Published Online: 9 JUN 2004
  2. Published Print: 15 MAR 2004

ISBN Information

Print ISBN: 9780471486404

Online ISBN: 9780470020432

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Summary

This chapter contains sections titled:

  • Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume