Chapter 4. X-Ray Detectors

  1. Kouichi Tsuji10,
  2. Jasna Injuk11 and
  3. René Van Grieken12
  1. L. Strüder1,2,
  2. G. Lutz1,2,
  3. P. Lechner2,3,
  4. H. Soltau2,3,
  5. P. Holl2,3,
  6. C. A. N. Conde4,
  7. M. Kurakado5,6,
  8. M. Galeazzi7,
  9. E. Figueroa-Feliciano8,
  10. W. Da̧browski9 and
  11. P. Gryboś9

Published Online: 9 JUN 2004

DOI: 10.1002/0470020431.ch4

X-Ray Spectrometry: Recent Technological Advances

X-Ray Spectrometry: Recent Technological Advances

How to Cite

Strüder, L., Lutz, G., Lechner, P., Soltau, H., Holl, P., Conde, C. A. N., Kurakado, M., Galeazzi, M., Figueroa-Feliciano, E., Da̧browski, W. and Gryboś, P. (2004) X-Ray Detectors, in X-Ray Spectrometry: Recent Technological Advances (eds K. Tsuji, J. Injuk and R. Van Grieken), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/0470020431.ch4

Editor Information

  1. 10

    Department of Applied Chemistry, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan

  2. 11

    Micro and Trace Analysis Center, University of Antwerp, Belgium

  3. 12

    Department of Chemistry, Micro and Trace Analysis Center, University of Antwerp, Universiteitsplein I, B-2610 Antwerp, Belgium

Author Information

  1. 1

    Max-Planck-Institute für Physik und extraterrestrische Physik, München and Garching, Germany

  2. 2

    Semiconductor Lab., MPI Halbleiterlabor, SIEMENS – Gelaende, Otto-Hahn-Ring 6, D-81739 München, Germany

  3. 3

    PNSensor, München, Germany

  4. 4

    Physics Department, University of Coimbra, P-3004-0516 Coimbra, Portugal

  5. 5

    Electronics and Applied Physics, Osaka Electro-Communication University, 18-8, Hatsucho, Neyagawa, Japan

  6. 6

    RIKEN, Saitama, Japan

  7. 7

    University of Miami, Department of Physics, PO Box 248046, Coral Gables, FL 33124, USA

  8. 8

    NASA/Goddard Space Flight Centre, Code 662, Greenbelt, MD 20771, USA

  9. 9

    Faculty of Physics and Nuclear Techniques, AGH University of Science and Technology, Al. Mickiewicza 30, 30–059 Krakow, Poland

Publication History

  1. Published Online: 9 JUN 2004
  2. Published Print: 15 MAR 2004

ISBN Information

Print ISBN: 9780471486404

Online ISBN: 9780470020432



This chapter contains sections titled:

  • Semiconductor Detectors for (Imaging) X-ray Spectroscopy

  • Gas Proportional Scintillation Counters for X-ray Spectrometry

  • Superconducting Tunnel Junctions

  • Cryogenic Microcalorimeters

  • Position Sensitive Semiconductor Strip Detectors