Chapter 5. Special Configurations

  1. Kouichi Tsuji10,
  2. Jasna Injuk11,
  3. René Van Grieken12
  1. K. Sakurai1,
  2. Kouichi Tsuji10,
  3. R. Cesareo2,
  4. A. Brunetti2,
  5. A. Castellano3,
  6. M. A. Rosales Medina4,
  7. F. Adams5,
  8. L. Vincze5,
  9. B. Vekemans5,
  10. I. Nakai6,
  11. S. Kuypers7,
  12. E. Van Cappellen8,
  13. J. Kawai9

Published Online: 9 JUN 2004

DOI: 10.1002/0470020431.ch5

Book Title

X-Ray Spectrometry: Recent Technological Advances

X-Ray Spectrometry: Recent Technological Advances

Additional Information

How to Cite

Sakurai, K., Tsuji, K., Cesareo, R., Brunetti, A., Castellano, A., Rosales Medina, M. A., Adams, F., Vincze, L., Vekemans, B., Nakai, I., Kuypers, S., Van Cappellen, E. and Kawai, J. (2004) Special Configurations, in X-Ray Spectrometry: Recent Technological Advances (eds K. Tsuji, J. Injuk and R. Van Grieken), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/0470020431.ch5

Editor Information

  1. 10

    Department of Applied Chemistry, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan

  2. 11

    Micro and Trace Analysis Center, University of Antwerp, Belgium

  3. 12

    Department of Chemistry, Micro and Trace Analysis Center, University of Antwerp, Universiteitsplein I, B-2610 Antwerp, Belgium

Author Information

  1. 1

    National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan

  2. 2

    Department of Mathematics and Physics, University of Sassari, Via Vienna 2, I-07100 Sassari, Italy

  3. 3

    Department of Materials Science, University of Lecce, I-73100 Lecce, Italy

  4. 4

    University of ‘Las Americas’, Puebla, CP 72820, Mexico

  5. 5

    Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Antwerp, Belgium

  6. 6

    Department of Applied Chemistry, Science University of Tokyo, 1-3 Kagurazaka, Shinjuku, Tokyo 162–0825, Japan

  7. 7

    Centre for Materials Advice and Analysis, Materials Technology Group, VITO (Flemish Institute for Technological Research), B-2400 Mol, Belgium

  8. 8

    FEI Company, 7451 N.W. Evergreen Parkway, Hillsboro, OR 97124-5830, USA

  9. 9

    Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto 606–8501, Japan

  10. 10

    Department of Applied Chemistry, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan

Publication History

  1. Published Online: 9 JUN 2004
  2. Published Print: 15 MAR 2004

ISBN Information

Print ISBN: 9780471486404

Online ISBN: 9780470020432

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CHAPTER TOOLS

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Summary

This chapter contains sections titled:

  • Grazing-incidence X-ray Spectrometry

  • Grazing-exit X-ray Spectrometry

  • Portable Equipment for X-ray Fluorescence Analysis

  • Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis

  • High-energy X-ray Fluorescence

  • Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy

  • Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy

  • X-ray Absorption Techniques

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