Chapter 7. New Applications

  1. Kouichi Tsuji10,
  2. Jasna Injuk11,
  3. René Van Grieken12
  1. J. Börjesson1,2,
  2. S. Mattsson2,
  3. Y. Mori3,
  4. A. Zucchiatti4,
  5. T. Ninomiya5,
  6. I. Szalóki6,
  7. C.-U. Ro7,
  8. J. Osán8,
  9. J. de Hoog12,
  10. René Van Grieken12

Published Online: 9 JUN 2004

DOI: 10.1002/0470020431.ch7

Book Title

X-Ray Spectrometry: Recent Technological Advances

X-Ray Spectrometry: Recent Technological Advances

Additional Information

How to Cite

Börjesson, J., Mattsson, S., Mori, Y., Zucchiatti, A., Ninomiya, T., Szalóki, I., Ro, C.-U., Osán, J., de Hoog, J. and Van Grieken, R. (2004) New Applications, in X-Ray Spectrometry: Recent Technological Advances (eds K. Tsuji, J. Injuk and R. Van Grieken), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/0470020431.ch7

Editor Information

  1. 10

    Department of Applied Chemistry, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan

  2. 11

    Micro and Trace Analysis Center, University of Antwerp, Belgium

  3. 12

    Department of Chemistry, Micro and Trace Analysis Center, University of Antwerp, Universiteitsplein I, B-2610 Antwerp, Belgium

Author Information

  1. 1

    Department of Diagnostic Radiology, Country Hospital, SE-301 85 Halmstad, Sweden

  2. 2

    Department of Radiation Physics, Lund University, Malmö University Hospital, SE-205 02 Malmö, Sweden

  3. 3

    Wacker-NSCE Corporation, 3434 Shimata, Hikari, Yamaguchi 743-0063, Japan

  4. 4

    Instituto Nazionale di Fisica Nucleare, Sezione di Genova, Via Dodecanesco 33, I-16146 Genova, Italy

  5. 5

    Forensic Science Laboratory, Hyogo Prefectural Police Headquarters, 5-4-1 Shimoyamate, Chuo-Ku, Kobe 650–8510, Japan

  6. 6

    Institute of Experimental Physics, University of Debrecen, Bem tér 18/a, H-4026 Debrecen, Hungary

  7. 7

    Department of Chemistry, Hallym University, Chun Cheon, Kang WonDo 200–702, Korea

  8. 8

    KFKI Atomic Energy Research Institute, Department of Radiation and Environmental Physics, PO Box 49, H-1525 Budapest, Hungary

  9. 12

    Department of Chemistry, Micro and Trace Analysis Center, University of Antwerp, Universiteitsplein I, B-2610 Antwerp, Belgium

Publication History

  1. Published Online: 9 JUN 2004
  2. Published Print: 15 MAR 2004

ISBN Information

Print ISBN: 9780471486404

Online ISBN: 9780470020432

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CHAPTER TOOLS

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Summary

This chapter contains sections titled:

  • X-ray Fluorescence Analysis in Medical Sciences

  • Total Reflection X-ray Fluorescence for Semiconductors and Thin Films

  • X-ray Spectrometry in Archaeometry

  • X-ray Spectrometry in Forensic Research

  • Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry

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