Chapter 8. Characterization of Colloidal Particles

  1. Jim W. Goodwin

Published Online: 1 JUL 2004

DOI: 10.1002/0470093919.ch8

Colloids and Interfaces with Surfactants and Polymers - An Introduction

Colloids and Interfaces with Surfactants and Polymers - An Introduction

How to Cite

Goodwin, J. W. (2004) Characterization of Colloidal Particles, in Colloids and Interfaces with Surfactants and Polymers - An Introduction, John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/0470093919.ch8

Author Information

  1. Interfacial Dynamics Corporation, Portland, Oregon, USA

Publication History

  1. Published Online: 1 JUL 2004
  2. Published Print: 9 JAN 2004

ISBN Information

Print ISBN: 9780470841433

Online ISBN: 9780470093917

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Keywords:

  • colloidal particles;
  • behaviour of colloidal systems;
  • optical microscopy;
  • Transmission electron microscopy (TEM);
  • electron probe microanalysis;
  • atomic force microscopy (AFM);
  • Fresnel diffraction;
  • scattered radiation;
  • electroviscous effects;
  • photon correlation spectroscopy

Summary

This chapter contains sections titled:

  • Introduction

  • Particle Size

  • Microscopy

  • Zonal Methods

  • Scattering Methods

  • Analysis of Scattered Radiation

  • Neutron Reflection

  • Dynamic Light Scattering

  • Characterization of the Electrical Properties of Particles

  • Viscosities of Dispersions

  • References