Chapter 8. Noise
Published Online: 9 OCT 2001
DOI: 10.1002/0471200689.ch8
Copyright © 2001 John Wiley & Sons, Inc.
Book Title

Radio Frequency Circuit Design
Additional Information
How to Cite
Davis, W. A. and Agarwal, K. K. (2001) Noise, in Radio Frequency Circuit Design, John Wiley & Sons, Inc., New York, USA. doi: 10.1002/0471200689.ch8
Publication History
- Published Online: 9 OCT 2001
Book Series:
Book Series Editors:
- Kai Chang
Series Editor Information
Texas A&M University
ISBN Information
Print ISBN: 9780471350521
Online ISBN: 9780471200680
- Summary
- Chapter
Keywords:
- noise;
- sources;
- thermal noise;
- Nyquist formula;
- black body radiation;
- noise circuit analysis;
- amplifier noise;
- characterization;
- measurement;
- two-port circuit;
- Fukui noise model;
- cascaded amplifiers;
- optimum gain;
- amplifier design;
- problems
Summary
Noise in electron tubes, semiconductor diodes, bipolar transistors, and field effect transistors comes from a variety of mechanisms. Random fluctuations of electrons in resistance would be expected to rise as temperature increases. The expression for such thermal noise voltage has been described several ways. When a circuit contains several resistors, the total noise power can be calculated by a combination of the resistors. An amplifier can measure how much noise it adds to the signal. Mathematical solutions for noise measurement are presented. Properties of cascaded amplifiers and design for optimal gain and noise are given.
