Chapter 8. Noise

  1. W. Alan Davis PhD1 and
  2. Krishna K. Agarwal PhD2

Published Online: 9 OCT 2001

DOI: 10.1002/0471200689.ch8

Radio Frequency Circuit Design

Radio Frequency Circuit Design

How to Cite

Davis, W. A. and Agarwal, K. K. (2001) Noise, in Radio Frequency Circuit Design, John Wiley & Sons, Inc., New York, USA. doi: 10.1002/0471200689.ch8

Author Information

  1. 1

    University of Texas at Arlington

  2. 2

    Raytheon Systems Company

Publication History

  1. Published Online: 9 OCT 2001

Book Series:

  1. Wiley Series in Microwave and Optical Engineering

Book Series Editors:

  1. Kai Chang

Series Editor Information

  1. Texas A&M University

ISBN Information

Print ISBN: 9780471350521

Online ISBN: 9780471200680

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Keywords:

  • noise;
  • sources;
  • thermal noise;
  • Nyquist formula;
  • black body radiation;
  • noise circuit analysis;
  • amplifier noise;
  • characterization;
  • measurement;
  • two-port circuit;
  • Fukui noise model;
  • cascaded amplifiers;
  • optimum gain;
  • amplifier design;
  • problems

Summary

Noise in electron tubes, semiconductor diodes, bipolar transistors, and field effect transistors comes from a variety of mechanisms. Random fluctuations of electrons in resistance would be expected to rise as temperature increases. The expression for such thermal noise voltage has been described several ways. When a circuit contains several resistors, the total noise power can be calculated by a combination of the resistors. An amplifier can measure how much noise it adds to the signal. Mathematical solutions for noise measurement are presented. Properties of cascaded amplifiers and design for optimal gain and noise are given.