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X-Ray Techniques, Introduction

X-Ray Techniques

  1. Alan I. Goldman

Published Online: 12 OCT 2012

DOI: 10.1002/0471266965.com070.pub2

Characterization of Materials

Characterization of Materials

How to Cite

Goldman, A. I. 2012. X-Ray Techniques, Introduction. Characterization of Materials. 1.

Author Information

  1. Iowa State University, Ames, IA, USA

Publication History

  1. Published Online: 12 OCT 2012

Abstract

X-ray scattering and spectroscopy methods can provide a wealth of information concerning the physical and electronic structure of crystalline and noncrystalline materials in a variety of external conditions and environments. X-ray powder diffraction, for example, is generally the first, and perhaps the most widely used, probe of crystal structure. Over the last 100 years, especially with the introduction of x-ray synchrotron sources during the last 35 years, x-ray techniques have expanded well beyond their initial role in structure determination.

This chapter explores the wide variety of applications of x-ray scattering and spectroscopy techniques to the study of materials.

Keywords:

  • X-ray techniques;
  • introduction;
  • X-ray scattering;
  • X-ray diffraction;
  • X-ray spectroscopy