Standard Article

XAFS Spectroscopy

X-Ray Techniques

  1. Steve Heald

Published Online: 18 MAY 2012

DOI: 10.1002/0471266965.com072.pub2

Characterization of Materials

Characterization of Materials

How to Cite

Heald, S. 2012. XAFS Spectroscopy. Characterization of Materials. 1–15.

Author Information

  1. Argonne National Laboratory, Advanced Photon Source, Argonne, IL, USA

Publication History

  1. Published Online: 18 MAY 2012

Options for accessing this content:

  • If you have access to this content through a society membership, please first log in to your society website.
  • Login via other institutional login options
  • You can purchase online access to this Article for a 24-hour period (price varies by title)
    • If you already have a Wiley Online Library or Wiley InterScience user account: login above and proceed to purchase the article.
    • New Users: Please register, then proceed to purchase the article.

Login via OpenAthens


Search for your institution's name below to login via Shibboleth.

Please register to:

  • Save publications, articles and searches
  • Get email alerts
  • Get all the benefits mentioned below!

Register now >