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Resonant Scattering Techniques

X-Ray Techniques

  1. Kenneth D. Finkelstein1,
  2. Vladimir E. Dmitrienko2

Published Online: 12 OCT 2012

DOI: 10.1002/0471266965.com075.pub2

Characterization of Materials

Characterization of Materials

How to Cite

Finkelstein, K. D. and Dmitrienko, V. E. 2012. Resonant Scattering Techniques. Characterization of Materials. 1–16.

Author Information

  1. 1

    Cornell University, Ithaca, NY, USA

  2. 2

    Institute of Crystallography, Moscow, Russia

Publication History

  1. Published Online: 12 OCT 2012

Abstract

This article describes resonant x-ray scattering by presenting its principles, illustrating them with several examples, providing background on experimental methods, and discussing the analysis of data. Principles of the method presented are the classical picture of x-ray scattering, including anomalous dispersion, followed by a quantum-mechanical description for the scattering amplitudes, and ends with a discussion on techniques of symmetry analysis useful in designing experiments. Two examples from the literature are used to illustrate the technique. This is followed by a discussion of experimental aspects of the method, including the principles of x-ray polarization analysis. A list of criteria is given for selecting systems amenable to the technique, along with an outline for experimental design. A general background on data collection and analysis includes references to sources of computational tools and expertise in the field.

Keywords:

  • resonant x-ray diffraction;
  • polarization analysis;
  • tensors;
  • anisotropy of structure factor;
  • chirality