Surface X-Ray Diffraction
Published Online: 12 OCT 2012
Copyright © 2003 by John Wiley & Sons, Inc. All rights reserved.
Characterization of Materials
How to Cite
Felici, R. 2012. Surface X-Ray Diffraction. Characterization of Materials. 1–20.
- Published Online: 12 OCT 2012
Surface x-ray diffraction is a technique sensitive to the atomic structure and morphology of surfaces and interfaces. As x-ray diffraction is used for the determination of three-dimensional crystal structures and, in doing this, also crystallographic parameters such as Debye–Waller factors (thermal vibration amplitudes) or occupancy factors are also accessed, so surface x-ray diffraction should be considered as a valid method for measuring these quantities too. Surface x-ray diffraction also probes surface morphological properties, such as roughness and facet formation, and allows for the investigation of their thermodynamic and kinetic aspects, such as the study of phase transitions in surfaces, or of growth phenomena, or of catalytic reactions.
- surface x-ray diffraction;
- grazing incidence;
- crystallographic measurements