In situ X-ray Measurement Methods
Published Online: 12 OCT 2012
Copyright © 2003 by John Wiley & Sons, Inc. All rights reserved.
Characterization of Materials
How to Cite
Stock, S. R. 2012. In situ X-ray Measurement Methods. Characterization of Materials. 1–21.
- Published Online: 12 OCT 2012
This article reviews in situ x-ray measurement methods including x-ray fluorescence (XRF), x-ray scattering and x-ray imaging. Three classes of in situ methods are covered: spectroscopy-based, scattering-based and imaging approaches. The spectroscopy treatment centers on x-ray excited analysis of x-ray fluorescence. The types of in situ characterization relying on x-ray scattering include: identification and quantification of crystallographic phases present, crystallographic texture (i.e., pole figures; orientation distribution functions, odf), residual stress measurement and crystal defect characterization (x-ray diffraction topography; rocking curve analysis). X-ray imaging includes radiography and computed tomography as well as mapping using diffracted or fluorescent signal.
- x-ray scattering;
- x-ray fluorescence;
- x-ray imaging;
- in situ measurement