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In situ X-ray Measurement Methods

X-Ray Techniques

  1. Stuart R. Stock

Published Online: 12 OCT 2012

DOI: 10.1002/0471266965.com134

Characterization of Materials

Characterization of Materials

How to Cite

Stock, S. R. 2012. In situ X-ray Measurement Methods. Characterization of Materials. 1–21.

Author Information

  1. Department of Molecular Pharmacology and Biological Chemistry, Feinberg School of Medicine, Northwestern University, Chicago, IL, USA

Publication History

  1. Published Online: 12 OCT 2012

Abstract

This article reviews in situ x-ray measurement methods including x-ray fluorescence (XRF), x-ray scattering and x-ray imaging. Three classes of in situ methods are covered: spectroscopy-based, scattering-based and imaging approaches. The spectroscopy treatment centers on x-ray excited analysis of x-ray fluorescence. The types of in situ characterization relying on x-ray scattering include: identification and quantification of crystallographic phases present, crystallographic texture (i.e., pole figures; orientation distribution functions, odf), residual stress measurement and crystal defect characterization (x-ray diffraction topography; rocking curve analysis). X-ray imaging includes radiography and computed tomography as well as mapping using diffracted or fluorescent signal.

Keywords:

  • x-ray scattering;
  • x-ray fluorescence;
  • x-ray imaging;
  • in situ measurement