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Fluctuation Electron Microscopy

Electron Techniques

  1. Paul Voyles,
  2. Jinwoo Hwang

Published Online: 12 OCT 2012

DOI: 10.1002/0471266965.com138

Characterization of Materials

Characterization of Materials

How to Cite

Voyles, P. and Hwang, J. 2012. Fluctuation Electron Microscopy. Characterization of Materials. 1–7.

Author Information

  1. University of Wisconsin, Department of Materials Science and Engineering, Madison, WI, USA

Publication History

  1. Published Online: 12 OCT 2012

Abstract

Fluctuation electron microscopy (FEM) is a nanodiffraction technique for measuring nanometer scale order in amorphous materials. Either dark-field transmission electron microscope imaging or coherent electron nanodiffraction in a scanning transmission electron microscope is used to measure the diffracted intensity from the sample with nanometer spatial resolution. Fluctuations in that intensity from place to place on the sample reveal the size, density, and internal atomic arrangements of nanometer-scale order. Nanometer scale order in glasses is also called medium-range order (MRO). Fluctuation microscopy is one of the few experimental techniques sensitive to this type of structure in amorphous materials.

Keywords:

  • fluctuation electron microscopy;
  • amorphous materials;
  • nanodiffraction;
  • FEM simulation;
  • medium-range order