Scanning Probe Microscopy Techniques, Introduction
Scanning Probe Techniques
Published Online: 12 OCT 2012
Copyright © 2003 by John Wiley & Sons, Inc. All rights reserved.
Characterization of Materials
How to Cite
Schwarz, A. 2012. Scanning Probe Microscopy Techniques, Introduction. Characterization of Materials. 1–2.
- Published Online: 12 OCT 2012
With the Nobel Prize awarded to Binnig and Rohrer for the development of Scanning Tunneling Microscopy (STM) and the invention of Atomic Force Microscopy (AFM) by Binnig, Quate and Gerber, 1986 can be seen as the starting year of a new era in surface science. Microscopy, literally “looking at small things,” became possible down to the atomic level in real space and soon after many more so-called Scanning Probe Microscopy (SPM) techniques based on either STM or AFM were born.
- scanning probe microscopy;
- scanning tunneling microscopy;
- atomic force microscopy;