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Scanning Probe Microscopy Techniques, Introduction

Scanning Probe Techniques

  1. Alexander Schwarz

Published Online: 12 OCT 2012

DOI: 10.1002/0471266965.com148

Characterization of Materials

Characterization of Materials

How to Cite

Schwarz, A. 2012. Scanning Probe Microscopy Techniques, Introduction. Characterization of Materials. 1–2.

Author Information

  1. Universität Hamburg, Hamburg, Germany

Publication History

  1. Published Online: 12 OCT 2012

Abstract

With the Nobel Prize awarded to Binnig and Rohrer for the development of Scanning Tunneling Microscopy (STM) and the invention of Atomic Force Microscopy (AFM) by Binnig, Quate and Gerber, 1986 can be seen as the starting year of a new era in surface science. Microscopy, literally “looking at small things,” became possible down to the atomic level in real space and soon after many more so-called Scanning Probe Microscopy (SPM) techniques based on either STM or AFM were born.

Keywords:

  • scanning probe microscopy;
  • scanning tunneling microscopy;
  • atomic force microscopy;
  • introduction