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Atomic Force Microscopy and Spectroscopy

Scanning Probe Techniques

  1. Hendrik Hölscher1,
  2. Jens Falter2,3,
  3. André Schirmeisen4

Published Online: 12 OCT 2012

DOI: 10.1002/0471266965.com150

Characterization of Materials

Characterization of Materials

How to Cite

Hölscher, H., Falter, J. and Schirmeisen, A. 2012. Atomic Force Microscopy and Spectroscopy. Characterization of Materials. 1–14.

Author Information

  1. 1

    Karlsruhe Institute of Technology (KIT), Eggenstein-Leopoldshafen, Germany

  2. 2

    Center for Nanotechnology (CeNTech), Münster, Germany

  3. 3

    Westfälische Wilhelms-Universität Münster, Munster, Germany

  4. 4

    Justus-Liebig-Universitat Gießen, Gießen, Germany

Publication History

  1. Published Online: 12 OCT 2012

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