Standard Article

Scanning Near-Field Optical Microscopy

Scanning Probe Techniques

  1. Michael R. Beversluis,
  2. Stephan J. Stranick

Published Online: 12 OCT 2012

DOI: 10.1002/0471266965.com153

Characterization of Materials

Characterization of Materials

How to Cite

Beversluis, M. R. and Stranick, S. J. 2012. Scanning Near-Field Optical Microscopy. Characterization of Materials. 1–12.

Author Information

  1. Surface Science and Microanalysis Division, The National Institute of Standards and Technology, Gaithersburg, MD, USA

Publication History

  1. Published Online: 12 OCT 2012

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