11. IDDQ

  1. Alexander Miczo

Published Online: 29 AUG 2003

DOI: 10.1002/0471457787.ch11

Digital Logic Testing and Simulation, Second Edition

Digital Logic Testing and Simulation, Second Edition

How to Cite

Miczo, A. (2003) IDDQ, in Digital Logic Testing and Simulation, Second Edition, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/0471457787.ch11

Publication History

  1. Published Online: 29 AUG 2003
  2. Published Print: 15 AUG 2003

ISBN Information

Print ISBN: 9780471439950

Online ISBN: 9780471457787

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Keywords:

  • IDDQ;
  • selecting vectors;
  • threshold;
  • measuring current;
  • burn-in;
  • large circuits;
  • problems

Summary

Test strategies described in previous chapters relied on two concepts: controllability and observability (C/O). Some solutions for solving C/O problems include scan path and the cross-check grid. In this chapter we discuss IDDQ monitoring, another approach that provides complete observability.