12. Behavioral Test and Verification

  1. Alexander Miczo

Published Online: 29 AUG 2003

DOI: 10.1002/0471457787.ch12

Digital Logic Testing and Simulation, Second Edition

Digital Logic Testing and Simulation, Second Edition

How to Cite

Miczo, A. (2003) Behavioral Test and Verification, in Digital Logic Testing and Simulation, Second Edition, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/0471457787.ch12

Publication History

  1. Published Online: 29 AUG 2003
  2. Published Print: 15 AUG 2003

ISBN Information

Print ISBN: 9780471439950

Online ISBN: 9780471457787

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Keywords:

  • behavioral test;
  • design verification;
  • simulation;
  • measuring simulation thoroughness;
  • random stimulus generation;
  • behavioral ATPG (BATG);
  • sequential circuit test search system (SCIRTSS);
  • Test Design Expert (TDX);
  • DEPOT (DEductive, Path-Oriented Trace)

Summary

In this chapter we focus on design verification, and attempt to answer the question, “Was the IC designed correctly?” We will show that, in the final analysis, manufacturing test and design verification share a common goal: reliable delivery of computation, control, and communication. If it doesn't work correctly, the customer doesn't care whether the problem occurred in the design or the fabrication.