4. Automatic Test Pattern Generation

  1. Alexander Miczo

Published Online: 29 AUG 2003

DOI: 10.1002/0471457787.ch4

Digital Logic Testing and Simulation, Second Edition

Digital Logic Testing and Simulation, Second Edition

How to Cite

Miczo, A. (2003) Automatic Test Pattern Generation, in Digital Logic Testing and Simulation, Second Edition, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/0471457787.ch4

Publication History

  1. Published Online: 29 AUG 2003
  2. Published Print: 15 AUG 2003

ISBN Information

Print ISBN: 9780471439950

Online ISBN: 9780471457787

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Keywords:

  • automatic test pattern generation;
  • sensitized path;
  • D-algorithm;
  • Testdetect;
  • subscripted D-algorithm;
  • PODEM (path oriented decision making);
  • FAN;
  • Socrates;
  • critical path;
  • critical path tracing;
  • Boolean differences;
  • Boolean satisfiability;
  • BDDs (binary decision diagrams);
  • ATPG (automatic test pattern generator)

Summary

In this chapter we focus our attention to the ATPG (automatic test pattern generator). We also examine two alternatives to fault simulation: testdetect and critical path tracing. These two methods share much common terminology, as well as methodology, with corresponding ATPGs, so it is convenient to group them with their corresponding ATPGs. We examine the algorithms and procedures for combinatorial logic and attempt to understand their strengths and weaknesses.