5. Sequential Logic Test

  1. Alexander Miczo

Published Online: 29 AUG 2003

DOI: 10.1002/0471457787.ch5

Digital Logic Testing and Simulation, Second Edition

Digital Logic Testing and Simulation, Second Edition

How to Cite

Miczo, A. (2003) Sequential Logic Test, in Digital Logic Testing and Simulation, Second Edition, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/0471457787.ch5

Publication History

  1. Published Online: 29 AUG 2003
  2. Published Print: 15 AUG 2003

ISBN Information

Print ISBN: 9780471439950

Online ISBN: 9780471457787

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Keywords:

  • sequential logic test;
  • test problems;
  • sequential test methods;
  • complexity;
  • sequential machines;
  • experiments;
  • sequential testability;
  • theoretical limit

Summary

In this chapter we create tests for sequential circuits where the outputs are a function not just of present inputs but of past inputs as well. Our objective is to create a sensitized path from the point where a fault occurs to an observable output. There are now new factors that must be considered. A sensitized path must be propagated not only through logic operators, but also through an entirely new dimension—time. The time dimension may be discrete, as in synchronous logic, or it may be continuous, as in asynchronous logic.