Chapter 9. Built-In Self-Test
Published Online: 29 AUG 2003
DOI: 10.1002/0471457787.ch9
Copyright © 2003 John Wiley & Sons, Inc.
Book Title
Digital Logic Testing and Simulation, Second Edition
Additional Information
How to Cite
Miczo, A. (2003) Built-In Self-Test, in Digital Logic Testing and Simulation, Second Edition, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/0471457787.ch9
Publication History
- Published Online: 29 AUG 2003
- Published Print: 15 AUG 2003
ISBN Information
Print ISBN: 9780471439950
Online ISBN: 9780471457787
- Summary
- Chapter
Keywords:
- built-in self-test (BIST);
- benefits;
- basic self-test paradigm;
- random pattern effectiveness;
- self-test applications;
- remote test;
- black box testing;
- fault tolerance
Summary
This chapter begins with a brief look at the benefits of BIST (built-in self-test). Then, circuits for creating stimuli and monitoring response are examined. The mathematical foundation underlying these circuits will be discussed, followed by a discussion of the effectiveness of BIST. Then some case studies are presented describing how BIST has been incorporated into some complex designs. Next, we examine test controllers, ranging from fairly elementary to quite complex. Later, we discuss circuit partitioning. Finally, fault tolerance is examined.